1983
DOI: 10.1109/tchmt.1983.1136183
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Fatigue Life of Leadless Chip Carrier Solder Joints During Power Cycling

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Cited by 308 publications
(72 citation statements)
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“…(6)) [7] developed by Engelmaier presents the influence of both temperature and frequency on creep-fatigue, where a logarithmic relationship between temperature and frequency is included.…”
Section: Brief Review Of Existing Creep-fatigue Modelsmentioning
confidence: 99%
“…(6)) [7] developed by Engelmaier presents the influence of both temperature and frequency on creep-fatigue, where a logarithmic relationship between temperature and frequency is included.…”
Section: Brief Review Of Existing Creep-fatigue Modelsmentioning
confidence: 99%
“…The Engelmaier model has been used in several studies to successfully estimate the fatigue life of eutectic Pb-Sn solder [12,13]. Engelmaier's model is a Coffin-Manson based relation that accounts for the mean temperature of the cycle, and the number of cycles per day…”
Section: Solder Fatigue Life Modelmentioning
confidence: 99%
“…Several researchers have reported successful results using the Kanchanomai model for Sn96.5-Ag3.5 which is similar in composition to Sn95-Sb5 [13,14]. Kanchanomai defined the number of cycles to failure by the following relationship:…”
Section: Solder Fatigue Life Modelmentioning
confidence: 99%
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“…Manson model for leadless components to determine the fatigue life relationship for temperature loading (50), (51) was selected to calculate the RUL. The damage to the components and time to failure due to the thermal cycling on the components were calculated.…”
mentioning
confidence: 99%