Fastpath: a path-delay test generator for standard scan designs

Path delay fault test generation for standard scan designs using state tuples

“…All the experiments were done for the functional justification test mode with a backtrack limit of 100 per path. Table 5.1 presents the experimental results of the proposed test generator and the industrial tool Fastpath described in [10]. Fastpath is a test generator capable of generating robust tests for standard scan designs.…”

“…It uses a 29-valued logic algebra to perform implications. Results of robust test generation for 1000 longest paths per circuit under the functional justification mode, using a backtrack limit of 10,000 per path, were given in [10]. The paths targeted in [10] were selected using a commercial timing analyzer.…”

“…Three test application methods were proposed to apply a two-pattern test to a scan design: enhanced scan, functional justification (also called broadside) and scan-shifting justification (also called skewed-load) [8,10,11]. For the enhanced scan test application method, each scan element in the scan chain is designed to store two bits by including an extra holding latch.…”

“…A 29-valued logic system was used in the test generator Fastpath [10] for industrial scan designs. In the experimental results section, we will compare the test generator reported here with the one reported in [10].…”

“…In order to facilitate efficient test generation for delay faults, several multiple-valued logic systems, which can distinguish different logic states of circuit lines, were proposed earlier [1,5,7,9,10,[11][12][13]17]. Each logic system is designed to target a specific problem.…”