Fast Scanning Laser-OES. II. Sample Material Ablation and Depth Profiling in Metals

Atomic spectrometry update. Industrial analysis: metals, chemicals and advanced materials

“…The same system was applied by Kuss et al to depth profiling and ablation of metals. 4 Minor elements in steels (Mo, Nb, Si and Ti) were determined by LIBS. 5 A long-term precision of 5% RSD (relative standard deviation) was observed for these elements.…”