1973
DOI: 10.2307/3224917
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Fast Scanning Electron Microscopic and Light Microscopic Correlation of Paraffin Sections and Chromosome Spreads of Nickel-Induced Tumor

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Cited by 6 publications
(3 citation statements)
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“…The other sequence, LM examination before SEM, is also possible and not only on paraffin-embedded sections (Geissinger, 1971;Geissinger et al, 1973;Poh et al, 1971;Riddle et al, 1976;Crocker et al, 1980), but also on thicker sections, for example those made from freshly extracted teeth (Mortimer & Tranter, 1971;Hubbard, 1982). Paraffinembedded sections can be investigated in the light microscope without staining, using Nomarski differential-interference contrast (Geissinger, 1971;Geissinger et al, 1973) or with staining using conventional LM (Geissinger, 1971;Riddle et al, 1976;Crocker et al, 1980). Before SEM processing and examination can be performed the coverslips and the paraffin are removed.…”
Section: Sectionsmentioning
confidence: 99%
“…The other sequence, LM examination before SEM, is also possible and not only on paraffin-embedded sections (Geissinger, 1971;Geissinger et al, 1973;Poh et al, 1971;Riddle et al, 1976;Crocker et al, 1980), but also on thicker sections, for example those made from freshly extracted teeth (Mortimer & Tranter, 1971;Hubbard, 1982). Paraffinembedded sections can be investigated in the light microscope without staining, using Nomarski differential-interference contrast (Geissinger, 1971;Geissinger et al, 1973) or with staining using conventional LM (Geissinger, 1971;Riddle et al, 1976;Crocker et al, 1980). Before SEM processing and examination can be performed the coverslips and the paraffin are removed.…”
Section: Sectionsmentioning
confidence: 99%
“…Specimen preparation techniques for tissue sections on slides, either formalin- (Poh et al, 1971) or glutaraldehyde- (Geissinger, Basrur & Yamashiro, 1973) fixed, or of minerals (Wilding & Geissinger, 1973), have been worked out and used successfully for correlative microscopy. Stained or unstained microtome section and smears on standard microscope slides can be examined in a light microscope in transillumination using every existing LM-technique (bright-field, oblique, dark-field, phase contrast, Nomarski differential interference contrast, polarizing, quantitative interference, and fluorescence microscopy).…”
Section: U L T I P L E Use O F I N S T R U M E N T a T I O N A N D mentioning
confidence: 99%
“…The SEM in the reflective scanning mode (secondary electron, primary backscattered electron, photon, and X-ray emission) and in the transmissive mode (Swift & Brown, 1970) yields a different type of information regarding a specimen, at axial and lateral resolution which are basically governed by electron optical parameters. The correlation of these two types of information has been demonstrated to be useful (McDonald & Hayes, 1969;Geissinger, 1971Geissinger, , 1972Poh et al, 1971;Geissinger et al, 1973;Wilding & Geissinger, 1973).…”
Section: U L T I P L E Use O F I N S T R U M E N T a T I O N A N D mentioning
confidence: 99%