Fast and Simple Specimen Preparation for TEM Studies of Oxide Films Deposited on Silicon Wafers

Teodorescu, V. S.; Blanchin, M. G.

doi:10.1017/s1431927609090011

Cited by 23 publications

(7 citation statements)

References 7 publications

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“…Furthermore, iTEM software (Radius 2.0 version, Emsis, Muenster, Germany) was used for imaging connected with MegaView III on the CM120ST microscope (Emsis, Muenster, Germany). Samples for TEM investigation were prepared using the scratch method [20] with a diamond knife and formvar-covered grids.…”

Section: Characterization Methodsmentioning

confidence: 99%

Synthesis and Characterization of Complex Nanostructured Thin Films Based on Titanium for Industrial Applications

et al. 2020

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Titanium-based composites—titanium and silver (TiAg) and titanium and carbon (TiC)—were synthesized by the Thermionic Vacuum Arc (TVA) method on substrates especially for gear wheels and camshaft coating as mechanical components of irrigation pumps. The films were characterized by surface morphology, microstructure, and roughness through X-ray Diffraction (XRD), Atomic Force Microscopy (AFM), Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM), and Small-Angle Neutron Scattering (SANS). The silver (Ag) films crystallized into a cubic system with lattice a = 4.0833 Å at room temperature, indexed as cubic Ag group Fm3m. The crystallites were oriented in the [111] direction, and mean grain size was <D>111 = 265 Å. The TiC structure revealed a predominant cubic TiC phase, with a = 0.4098 as a lattice parameter determined by Cohen’s method. Average roughness (Ra) was 8 nm for the as-grown 170 nm thick TiAg film, and 1.8 nm for the as-grown 120 nm thick TiC film. Characteristic SANS contribution was detected from the TiAg layer deposited on a substrate of high-quality stainless steel with 0.45% carbon (OLC45) in the range of 0.015 Å−1 ≤ Q ≤ 0.4 Å−1, revealing the presence of sharp surfaces and an averaged triaxial ellipsoidal core-shell object.

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Section: Characterization Methodsmentioning

confidence: 99%

Synthesis and Characterization of Complex Nanostructured Thin Films Based on Titanium for Industrial Applications

et al. 2020

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“…Thus, for nanoparticles, a dilution was carried out in alcohol, from which a drop was taken on the TEM grid, covered with formvar. For thin films, the quick method [3] was chosen. In this case there is a risk of defects in the film, but they can be avoided by means of selecting suitable area from the preview using TEM images.…”

Section: Methodsmentioning

confidence: 99%

Comparative Analysis of Electron Diffraction Pattern Obtained Without and With Precession System

MANU¹,

CIUPINA²,

PRODAN³

2020

JOR

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Electron diffraction is an additional technique in electronic microscopy studies. Since the XRD or neutron diffraction techniques was used intensely for crystalline structure determination, electron diffraction has potential for special cases were even this technique fails. Due to several factor the electron diffraction is not suitable for crystal structure determination, but with hardware and software improvement we can transform this technique in useful one. We show here an example of analysis of five different samples using combined technique, such as TEM/HRTEM image, electron diffraction without and with improvement provided by a precession system. We highlight the cases were electron diffraction succeed and the cases were failed, even the precession system is used.

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“…Additionally, transmission electron microscopy (TEM) examinations were conducted using a CM 120 ST microscope (Philips N.V., Amsterdam, The Netherlands), which operated at 120 kV and had a point-to-point resolution of 0.24 nm. The samples for the TEM investigation were dispersed in ethylic alcohol and collected on 300 mesh coated grids [53,54].…”

Section: Methodsmentioning

confidence: 99%

Pulsed Laser Fabrication of TiO2 Buffer Layers for Dye Sensitized Solar Cells

et al. 2019

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We report on the fabrication of dye-sensitized solar cells with a TiO2 buffer layer between the transparent conductive oxide substrate and the mesoporous TiO2 film, in order to improve the photovoltaic conversion efficiency of the device. The buffer layer was fabricated by pulsed laser deposition whereas the mesoporous film by the doctor blade method, using TiO2 paste obtained by the sol–gel technique. The buffer layer was deposited in either oxygen (10 Pa and 50 Pa) or argon (10 Pa and 50 Pa) onto transparent conducting oxide glass kept at room temperature. The cross-section scanning electron microscopy image showed differences in layer morphology and thickness, depending on the deposition conditions. Transmission electron microscopy studies of the TiO2 buffer layers indicated that films consisted of grains with typical diameters of 10 nm to 30 nm. We found that the photovoltaic conversion efficiencies, determined under standard air mass 1.5 global (AM 1.5G) conditions, of the solar cells with a buffer layer are more than two times larger than those of the standard cells. The best performance was reached for buffer layers deposited at 10 Pa O2. We discuss the processes that take place in the device and emphasize the role of the brush-like buffer layer in the performance increase.

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Fast and Simple Specimen Preparation for TEM Studies of Oxide Films Deposited on Silicon Wafers

Cited by 23 publications

References 7 publications

Synthesis and Characterization of Complex Nanostructured Thin Films Based on Titanium for Industrial Applications

Synthesis and Characterization of Complex Nanostructured Thin Films Based on Titanium for Industrial Applications

Comparative Analysis of Electron Diffraction Pattern Obtained Without and With Precession System

Pulsed Laser Fabrication of TiO2 Buffer Layers for Dye Sensitized Solar Cells

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