Far-field measurements of short-wavelength surface plasmons

Abstract

We present direct far-field measurements of short-wavelength surface plasmon polaritons (SPP) by conventional optics means. Plasmonic wavelength as short as 231 nm was observed for 532 nm illumination on a Ag−Si3N4 platform, demonstrating the capability to characterize SPPs well below the optical diffraction limit. This is done by scaling a sub-wavelength interferometric pattern to a far-field resolvable periodicity. These subwavelength patterns are obtained by coupling light into counter-propagating SPP waves to create a standing-wave pattern of half the SPP wavelength periodicity. Such patterns are mapped by a scattering slit, tilted at an angle so as to increase the periodicity of the intensity pattern along it to more than the free-space wavelength, making it resolvable by diffraction limited optics. The simplicity of the method as well as its large dynamic range of measurable wavelengths make it an optimal technique to characterize the properties of plasmonic devices and high-index dielectric waveguides, to improve their design accuracy and enhance their functionality.