Abstract-This paper studies the impact of the accelerated thermal aging on the conducted emission produced by a synchronous buck converter. The most degraded devices mounted on the DC-DC converter are identified and modeled in order to simulate the evolution of conducted emission and anticipate risks of non-compliance to emission requirements.Keywords-DC-DC converter; electromagnetic emission; accelerated aging; degradation modeling
I. INTRODUCTIONBecause of their high power efficiency, switch-mode power supplies (SMPS) are widely used in electronic applications [1]. However, one main drawback of SMPS is the noise produced by the switching activity, responsible for conducted and radiated electromagnetic emission (EME). Therefore, the management of the parasitic emission of SMPS is a frequent topic in the literature on electromagnetic compatibility (EMC). Numerous papers dealt with the origin and the modeling of EME, and also the development of design guidelines to improve these issues [2] [3]. Several recent studies presented the long-term behavior of SMPS. As a result of the degradation of the electrolytic capacitors which are used to filter the output voltage of SMPS, an increase of ripple in the output voltage of SMPS was illustrated in [4] [5]. Another consequence is the increase of EME, as shown in [6], which is associated with the degradation of filtering passive devices.This work is an extension of [6], where the different devices that form a synchronous buck converter (capacitor, inductor, ferrite bead, diode, power MOSFET) are stressed thermally. Their impact on the evolution of EME is studied by simulation. Besides, the study presented in [6] focuses only on the conducted emission (CE) at the output of the DC-DC converter. This work includes the measurement and the simulation of the CE at the input of the DC-DC converter. the paper is organized as follows: the first section describes the studied DC-DC converter, the tested devices and the accelerated aging method. The second section presents the experimental results of characterization of stressed devices and their modeling. In the last section, the model of stressed devices are used to simulate the effect of thermal aging on the CE produced by the DC-DC converter. The influence of aging of different filtering passive devices is compared.
II. PRESENTATION OF THE CASE STUDY
A. Description of the DC-DC converterThe studied synchronous buck converter is mounted on a 55x58 mm four-layer board. This type of circuit is one of the major contributor of conducted and radiated emission in electronic systems. A simplified schematic of the converter is presented in Fig. 1. It is based on the LT3800 controller from Linear Technology, configured in step-down operation to convert the 12 V voltage provided by a battery into a 5 V regulated voltage for a maximum current of 10 A. This circuit drives the gates of two power NMOSFET (Q1, Q2) mounted in D 2 PAK package. A Schottky diode (D) is mounted in parallel to Q2. The switching frequency is set to 200 KHz. An external...