2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) 2021
DOI: 10.1109/ipfa53173.2021.9617299
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Failure Analysis on Diode-triggered Silicon-Controlled Rectifiers By using Nondestructive X-ray Microscopy

Xinqian Chen
1
,
Mengge Jin
2
,
Feihou Feihou
3
et al.
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