Factors influencing charge capacity of vanadium pentoxide thin films during lithium ion intercalation/deintercalation cycles

Alamarguy, David; Castle, J. E.; Ibriş, Neluţă; Salvi, Anna Maria

doi:10.1116/1.2799961

Cited by 9 publications

(9 citation statements)

References 27 publications

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“…SIMS has been used to obtain elemental depth profiles of the electrode materials [14,15], however, determination of lithium ion diffusion coefficients have not been carried out. The thin film of 6 Li-enriched LiMn 2 O 4 was prepared by sputtering.…”

Section: Introductionmentioning

confidence: 99%

Determination of lithium ion diffusion in lithium–manganese-oxide-spinel thin films by secondary-ion mass spectrometry

Okumura

Fukutsuka

Uchimoto

et al. 2009

Journal of Power Sources

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Section: Introductionmentioning

confidence: 99%

Determination of lithium ion diffusion in lithium–manganese-oxide-spinel thin films by secondary-ion mass spectrometry

Okumura

Fukutsuka

Uchimoto

et al. 2009

Journal of Power Sources

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“…Li concentration in the samples was evaluated by calculating Li/V ratio and this was performed by integrating the corresponding intensities over the film thickness. 4 The results for the Li/V ratios, in the bulk and at the inner film interface, are shown in Figure 7 and show the evidence of interface transport of Li using the electrochemical setup in Figure 2a. There is some intercalation of the film but the dominant feature is the presence of Li within the interface region.…”

Section: Resultsmentioning

confidence: 89%

“…3 nm) of the surface, possibly associated with trapped lithium ions. 4,5 Recent SIMS analysis have shown some accumulation of Li + at both interfaces, the one exposed to the electrolyte and the buried one between V 2 O 5 and ITO. 6 This accumulation of Li + is a severe source of error for the computation of the thin film average stoichiometry from the inserted cation charge, and may have a deleterious influence on device performance due to problems associated with lithium trapping and charge transport across any one of the two interfaces.…”

mentioning

confidence: 99%

Li+ distribution into V2O5 films resulting from electrochemical intercalation reactions

Decker¹,

Donsanti²,

Salvi³

et al. 2008

J. Braz. Chem. Soc.

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Estudamos os efeitos de interface de filmes finos de eletrodos de V 2 O 5 sobre vidros com óxido de índio-estanho (ITO) para intercalação de Li utilizando combinações de métodos: perfil de profundidade por espectrometria de massas de íons secundários (SIMS), inserção-extração eletroquímica de íons lítio por voltametria cíclica de varredura lenta (SSCV) e por técnica de titulação potenciostática intermitente (PITT). Nós demonstramos que a distribuição de Li + no interior do filme de óxido é sempre distante de ser considerada homogênea e que diferentes etapas de difusão (paralelas às interfaces e bem como perpendiculares a elas) são consideradas por conter áreas de alguns cm 2 em experimentos com eletrodos. A margem exposta pelo corte da placa de vidro revestida com ITO e recoberta com V 2 O 5 desempenha um papel importante no processo, pelo fato de expor a interface V 2 O 5 -ITO ao eletrólito.We studied interface effects of thin film V 2 O 5 electrodes on top of indium tin oxide (ITO) glass for Li intercalation by means of a combination of methods: depth-profiling by secondary ion mass spectroscopy (SIMS), electrochemical insertion-extraction of lithium ions by slow-scan cyclic voltammetry (SSCV) and by potentiostatic intermittent titration technique (PITT). We show that the Li + distribution inside the oxide film is always far from homogeneous, and that different diffusion paths (parallel to interfaces as well as perpendicular to them) have to be considered in experiments with electrodes having areas of few cm 2 . The exposed edge formed when cutting out coupons from the coated glass plate supporting the V 2 O 5 electrode plays a significant role in the process, because it exposes the V 2 O 5 -ITO interface to the electrolyte.

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“…XPS has also enabled measurement of the thickness and composition of the V 2 O 5 -electrolyte interface and provided evidence of a small concentration of non-reactive V 4+ within the top few nanometres (ca 3 nm) of the surface, possibly associated with trapped lithium ions. [6] SIMS-depth profiling gave evidence of diffusion of Li ions through the ITO/V 2 O 5 interface and showed that lithium was present in the interface region of the part of the sample that was…”

Section: Introductionmentioning

confidence: 99%

“…[6] Figure 1 summarises the findings that are pertinent to this study. The sample was intercalated and deintercalated through 598 cycles and removed for examination in the deintercalated state.…”

mentioning

confidence: 99%

XPS and TOF‐SIMS study of the distribution of Li ions in thin films of vanadium pentoxide after electrochemical intercalation

Castle

Decker

Salvi

et al. 2008

Surface & Interface Analysis

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The intercalation of vanadium pentoxide by lithium ions leads to a change in optical properties, a process that is of value in thin-film electrochromic devices. The extent of intercalation can be measured, electrochemically, from the charge capacity of the film and, is in good agreement with that determined in the outermost layers by X-ray photoelectron spectroscopy (XPS), when intercalation occurs homogeneously through the film thickness. SIMS profiles of V 2 O 5 -deposited on ITO-glass coupons have allowed examination of the interface between these layers and in prior work showed a marked build up of Li in this interphase. Investigation of the distribution of lithium within the interphase showed it to be present in parts of the testpiece that were not immersed in the electrolyte used for Li insertion. In this work we have tested the suggestion that the lithium found in the interface can be introduced, during intercalation, via the exposed edge of the V 2 O 5 /ITO interface at the periphery of the sample. A series of intercalation cycles using modified cells to expose either: a) the periphery; or b) the centre; of the thin film have been carried out. The distribution of lithium after intercalation has been examined using a combination of ToF-SIMS and XPS. XPS showed lithium in the film to be related only to the immersed regions of the testpiece whilst SIMS profiles confirmed the widespread distribution of Li through the interface, only when an edge was exposed. We work confirms an important influence of an unsealed edge when samples are produced by cutting from larger glass plates.

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Factors influencing charge capacity of vanadium pentoxide thin films during lithium ion intercalation/deintercalation cycles

Cited by 9 publications

References 27 publications

Determination of lithium ion diffusion in lithium–manganese-oxide-spinel thin films by secondary-ion mass spectrometry

Determination of lithium ion diffusion in lithium–manganese-oxide-spinel thin films by secondary-ion mass spectrometry

Li+ distribution into V2O5 films resulting from electrochemical intercalation reactions

XPS and TOF‐SIMS study of the distribution of Li ions in thin films of vanadium pentoxide after electrochemical intercalation

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