2011
DOI: 10.1016/j.jcrysgro.2011.09.047
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Fabrication of α-TeO2 smooth and beaded microwires by thermal evaporation method

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Cited by 16 publications
(8 citation statements)
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“…Tellurium oxide thin films have been prepared by various techniques such as reactive sputtering [10], dip-coating [11] and vapor deposition [12]. However, so far there are a few works reported in literature relating to the synthesis of α-TeO 2 nano and microstructures [13][14][15][16][17][18][19]. Jiang et al [13] fabricated tellurium oxide nanorods by laser ablation of elemental tellurium on the glass substrate in a hot air atmosphere.…”
Section: Introductionmentioning
confidence: 99%
“…Tellurium oxide thin films have been prepared by various techniques such as reactive sputtering [10], dip-coating [11] and vapor deposition [12]. However, so far there are a few works reported in literature relating to the synthesis of α-TeO 2 nano and microstructures [13][14][15][16][17][18][19]. Jiang et al [13] fabricated tellurium oxide nanorods by laser ablation of elemental tellurium on the glass substrate in a hot air atmosphere.…”
Section: Introductionmentioning
confidence: 99%
“…Characterization of gCN-TZ nanocomposites X-ray diffraction results of the as-synthesized gCN-TZ and pristine ZnO NPs showed 2θ values related to (100), ( 101), (102), (110), ( 103) and (112) planes (figure 2), corresponding to the hexagonal wurtzite phase of ZnO (JCPDS card No: 5-0664) [22]. Herein, broad diffraction peaks at 28.96 °is ascribed to TeO 2 [24,25].The average grain size of 5% TZ is found to be 14 nm and 2% g-CN-TZ showed 35 nm, which are calculated using Image J software. In XRD, the peaks corresponding to gCN are visible only from 20% gCN onwards, as shown in figure 1.…”
Section: Resultsmentioning
confidence: 98%
“…In addition to the loss of active materials due to the shuttle effect, we also investigated the negative effects of volume variation that ZnTe electrodes suffer during the discharge/charge process. According to the densities of ZnTe (6.34 g cm −3 ), [ 40 ] Te (6.24 g cm −3 ), [ 41 ] and TeO 2 (5.67 g cm −3 ), [ 42 ] the molar volumes of ZnTe, Te and TeO 2 are calculated to be 30.44, 20.45 and 28.14 cm 3 mol −1 , respectively. Therefore, the volume expansion rate (%∆V) of Te to ZnTe and Te to TeO 2 should be 49% and 38%, respectively, according to the following equation: [ 43 ] %ΔV0.33embadbreak=(VnormalfVnormali)/Vi100%$$\begin{equation}{\mathrm{\% \Delta }}V\ = ({V}_{\mathrm{f}}\ - {V}_{\mathrm{i}})/{V}_{\mathrm{i}}{\mathrm{*}}100{\mathrm{\% }}\end{equation}$$where V f and V i are the molar volume of the material before and after conversion, respectively.…”
Section: Resultsmentioning
confidence: 99%
“…In addition to the loss of active materials due to the shuttle effect, we also investigated the negative effects of volume variation that ZnTe electrodes suffer during the discharge/charge process. According to the densities of ZnTe (6.34 g cm −3 ), [40] Te (6.24 g cm −3 ), [41] and TeO 2 (5.67 g cm −3 ), [42] the molar volumes of ZnTe, Te and TeO 2 are calculated to be 30.44, 20.45 and 28.14 cm 3 mol −1 , respectively. Therefore, the volume expansion rate (%∆V) of Te to ZnTe and Te to TeO 2 should be 49% and 38%, respectively, according to the following equation: [43] %ΔV…”
Section: Failure Mechanismmentioning
confidence: 99%