High Ga content Cu(In,Ga)Se 2 thin films incorporated sulfur were prepared by sequential evaporation from CuGaSe 2 and CuInSe 2 ternary compounds and subsequently Ga 2 Se 3 , In 2 Se 3 and In 2 S 3 binary compounds. The In 2 S 3 /(Ga 2 Se 3 + In 2 Se 3 ) ratio was varied from 0 to 0.13, and the properties of the thin films were investigated. XRD studies demonstrated that the prepared thin films had a chalcopyrite Cu(In,Ga)Se 2 structure. The S/(Se+S) mole ratio in the thin films was within the range from 0 to 0.04. The band gaps of Cu(In,Ga)Se 2 thin films increased from 1.30 eV to 1.59 eV with increasing the In 2 S 3 /(Ga 2 Se 3 + In 2 Se 3 ) ratio.