Yttria-stabilised zirconia (YSZ) films were deposited by atomic layer epitaxy (ALE) using Zr(thd) 4 , Cp 2 Zr(CH 3 ) 2 and Cp 2 ZrCl 2 as zirconium precursors. Y(thd) 3 and ozone were used as yttrium and oxygen sources, respectively. YSZ films were grown at 375 uC from Y(thd) 3 /O 3 -Zr(thd) 4 /O 3 . Deposition temperatures were 310-365 uC for the Y(thd) 3 /O 3 -Cp 2 Zr(CH 3 ) 2 /O 3 and 275-350 uC for the Y(thd) 3 /O 3 -Cp 2 ZrCl 2 /O 3 precursor combinations. Growth rates with a Y to Zr pulsing ratio of 1 : 1 were 0.56, 0.79 and 0.89 A (cycle) 21 when Zr(thd) 4 , Cp 2 Zr(CH 3 ) 2 and Cp 2 ZrCl 2 were used as zirconium precursors, respectively. Crystallinity and surface morphology of the deposited films were characterised by XRD and AFM while TOF-ERDA, XRF and SEM-EDX were used to analyse stoichiometry and possible impurities. The YSZ films were (100) oriented when deposited with a Y to Zr pulsing ratio of 1 : 1. Only thinner films (v60 nm), deposited from Y(thd) 3 /O 3 -Zr(thd) 4 /O 3 , showed the (111) preferred orientation. The lattice parameter was in the range of 5.09-5.28 A ˚when the Y 2 O 3 content was 5-89 mol%. When Cp 2 ZrCl 2 was used as zirconium precursor, 0.1-1.7 mol% chlorine was observed in the films. According to the AFM analysis, roughness was dependent on the pulsing ratio of the Y and Zr precursors.