Fabrication of optically smooth Sn thin films

Borra, Vamsi; Georgiev, Daniel G.; Grice, Corey R.

doi:10.1016/j.tsf.2016.08.042

Cited by 9 publications

(3 citation statements)

References 10 publications

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“…(1) The evaporated samples were made using a Denton vacuum thermal evaporator (DV-502A turbo auto high vacuum evaporator) and Sn pellets (from Kurt J. Lesker) of 99.999% purity. Following the recipe described in earlier publications, [26][27][28] we used 3 mm thick Pilkington TEC-15 glass (soda lime glass, coated with Fluorine doped Tin Oxide with a sheet resistance of 15 Ω/ ) as a substrate. The film thickness was close to 250 nm as determined with a quartz crystal microbalance thickness monitor.…”

Section: A Sample Preparationmentioning

confidence: 99%

The statistics of tin whisker diameters versus the underlying film grains

Oudat¹,

Borra²,

Georgiev³

et al. 2019

J. Phys. D: Appl. Phys.

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We compare the statistics of tin whisker diameters to that of the underlying film grains. Both are well approximated by the lognormal distributions. However, the parameters of those distributions can be rather different, not confirming the assumption that each whisker grows from a single grain. We conclude that several adjacent grains with similar crystal orientations can contribute to a whisker development. Our observations are consistent with the recent theory of multi-filament whisker structure. A modification of the particle size log-normal distribution is developed clarifying the nature of its dispersion.

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Section: A Sample Preparationmentioning

confidence: 99%

The statistics of tin whisker diameters versus the underlying film grains

Oudat¹,

Borra²,

Georgiev³

et al. 2019

J. Phys. D: Appl. Phys.

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“…NiO layer is then deposited on the NSL samples by reactive radio frequency magnetron sputtering of a 99.99% pure-Ni target in a 20:80 oxygen to argon partial pressure to a thickness of 100 nm [35]. Finally, a 250 nm (±40 nm) Sn layer is deposited on NSL and control samples simultaneously by vacuum evaporation of 99.999% pure Sn (from Kurt J Lesker) as described elsewhere [36]. The evaporation steps of Cu and Sn were carried out in a Denton Vacuum machine (model DV-502A) at a base vacuum of (3.5-4.8) × 10 −6 Pa.…”

Section: Methodsmentioning

confidence: 99%

Sn whisker growth mitigation by using NiO sublayers

Borra

Itapu

Georgiev

2017

J. Phys. D: Appl. Phys.

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The potential of NiO sublayers for whisker growth mitigation has been examined. A thin NiO film was applied on a Cu-coated substrate before the deposition of a thicker Sn layer. The growth of Sn whiskers was then followed by optical and scanning electron microscopy and was compared with the whisker growth on a control sample without the NiO sublayer. No whiskers were observed on the sample with the NiO layer even after 12 months, whereas the control sample developed whiskers of size and density that is generally expected, based on the vast amount of published work on the topic. The mechanisms of whisker growth and whisker growth suppression are briefly discussed as well.

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“…Sn samples were prepared by vacuum evaporation of 99.999% pure Sn (from Kurt J. Lesker) from tungsten boats onto the substrates; the detailed fabrication process steps are described in Ref. 10. Sn layers of 250±25nm thickness were deposited at a growth rate of 2-4 Å/s through stainless steel masks, resulting in a set of 5 mm wide Sn strips over continuous TCO coating.…”

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Whisker growth on Sn thin film accelerated under gamma-ray irradiation

Killefer,

Borra,

Al-Bayati

et al. 2017

Preprint

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We report on the growth of tin (Sn) metal whiskers that is significantly accelerated under gammaray irradiation. The studied Sn thin film, evaporated on glass substrate, was subjected to a total of 60 hours of irradiation over the course of 30 days. The irradiated sample demonstrated enhanced whisker development, in both densities and lengths, resulting in an acceleration factor of ∼50. We attribute the observed enhancement to gamma-ray induced electrostatic fields, affecting whisker growth kinetics. These fields are due to the substrate charging under ionizing radiation of gammarays. We propose that gamma-ray irradiation can be a tool for accelerated testing of whisker propensity.

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Fabrication of optically smooth Sn thin films

Cited by 9 publications

References 10 publications

The statistics of tin whisker diameters versus the underlying film grains

The statistics of tin whisker diameters versus the underlying film grains

Sn whisker growth mitigation by using NiO sublayers

Whisker growth on Sn thin film accelerated under gamma-ray irradiation

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