“…3 C. The XRD pattern of CuO corresponds to the JCPDS # 00–045-0937. The diffraction peaks at 2θ values of 32.60, 35.60, 38.80, 48.92, 53.68, 58.40, 61.68, 66.48, 68.20, 72.72 and 75.28 could be indexed as (− 110), (002), (111), (− 202), (020), (202), (− 113), (− 311), (− 220), (311) and (− 222) planes, respectively 44 . According to diffractogram b, the ZnO XRD planes at 2θ values of 31.80, 34.40, 36.25, 47.50, 56.60, 62.95, 66.50 and 68.05 could be indexed as (100), (002), (101), (102), (110), (103), (200) and (201) planes in correspondence with JCPDS # 00–036-1451.…”