2007
DOI: 10.1002/xrs.967
|View full text |Cite
|
Sign up to set email alerts
|

Fabrication of array detectors with 100 superconducting tunnel junctions and Ta x‐ray absorbers

Abstract: We have developed superconducting tunnel junction (STJ) x‐ray array detectors with a large detection area, high detection efficiency, and high counting rate. The STJ array detectors consist of 100 Nb/Al‐AlOx/Al/Nb STJs with a size of 200 × 200 µm. Each STJ has a 2 µm thick Ta absorber connected to the top Nb layer through a thin insulating layer. The absorbers act as an energy converter from high x‐ray energies to phonon energies, which are compatible with superconducting energy gaps. The array detectors reali… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
2

Citation Types

1
5
1

Year Published

2008
2008
2023
2023

Publication Types

Select...
7

Relationship

1
6

Authors

Journals

citations
Cited by 10 publications
(7 citation statements)
references
References 10 publications
1
5
1
Order By: Relevance
“…One group exhibits a low subgap current. The I-V curves of the low-current group are similar to that of a previously reported 100-m STJ that showed excellent X-ray detection properties [8]. In the other group, the curves show an excess current at a voltage greater than 0.1 mV.…”
Section: Resultssupporting
confidence: 85%
See 2 more Smart Citations
“…One group exhibits a low subgap current. The I-V curves of the low-current group are similar to that of a previously reported 100-m STJ that showed excellent X-ray detection properties [8]. In the other group, the curves show an excess current at a voltage greater than 0.1 mV.…”
Section: Resultssupporting
confidence: 85%
“…The yield of the 200-m STJ, which is defined by the portion of pixels having a subgap current less than 10 nA, is approximately 90%. The typical subgap current values in the present study are two orders of magnitude lower than those in a previous study [8].…”
Section: Resultscontrasting
confidence: 81%
See 1 more Smart Citation
“…It is already known that the SiO 2 residual layer on the top Nb surface causes low‐energy artifact events 5. Therefore, in our fabrication processes, the sensitive area was patterned by removing the SiO 2 isolation layer with a lift‐off technique 6. The sensitive area is defined by a photoresist pattern and then the SiO 2 layer is deposited.…”
Section: Introductionmentioning
confidence: 99%
“…8,9) However, single conventional STJs are unsatisfactory for the fluorescence XAFS measurement of light trace elements because of three disadvantages. 5,6,[10][11][12][13][14][15][16][17][18] First, their sensitive areas should be limited to $0:01 mm 2 to maintain the intrinsic good energy resolution due to their capacitances and leakage currents. Second, the counting rate is limited to $10 kcps by tunneling times longer than 0.1 s. Third, spectral artifacts are generated in soft X-ray spectra obtained by conventional STJs, and interfere with the detection of low-concentration light elements.…”
Section: Introductionmentioning
confidence: 99%