2012
DOI: 10.1007/s00542-012-1550-9
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Fabrication of aluminium doped zinc oxide piezoelectric thin film on a silicon substrate for piezoelectric MEMS energy harvesters

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Cited by 43 publications
(19 citation statements)
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“…Some piezoelectric materials are widely used in MEMS energy harvesters, which are aluminum nitride (AlN) [18,19], zinc oxide (ZnO) [20,21], and Pb(Zr x Ti 1-x )O 3 (PZT) [22,23,24,25,26,27]. Among these, PZT has a higher electromechanical coupling coefficient compared with AlN and ZnO.…”
Section: Introductionmentioning
confidence: 99%
“…Some piezoelectric materials are widely used in MEMS energy harvesters, which are aluminum nitride (AlN) [18,19], zinc oxide (ZnO) [20,21], and Pb(Zr x Ti 1-x )O 3 (PZT) [22,23,24,25,26,27]. Among these, PZT has a higher electromechanical coupling coefficient compared with AlN and ZnO.…”
Section: Introductionmentioning
confidence: 99%
“…The piezoelectric material is chosen based on its CMOS compatibility, ease of deposition, electromechanical and piezoelectric properties (Md- Ralib et al 2012). Non-ferroelectric piezoelectric materials such as ZnO and AlN have high k 2 , and are highly compatible with CMOS processing making them attractive for SAW applications.…”
Section: Zno Versus Aln As Piezoelectric Thin Filmsmentioning
confidence: 99%
“…ZnO and AlN are wurtzite-structured thin film piezoelectric materials with the polar direction giving piezoelectric response along crystallographic direction (Bassiri-Gharb 2008). Both ZnO and AlN are non-ferroelectric materials do not require poling or post-deposition annealing (Md- Ralib et al 2012). To achieve high electromechanical coupling coefficient, we explore the usage of AlN and ZnO thin films as the piezoelectric layer.…”
Section: Zno Versus Aln As Piezoelectric Thin Filmsmentioning
confidence: 99%
“…The existence of defects, such as Zn interstitial atoms or O atom vacancies, during the preparation of pure ZnO thin films results in ZnO thin films representing as n-type semiconductors. Thus, it is possible to change the conductivity of semiconductor materials with the incorporation of certain impurities (Li, Al, Na, Mg, et al) [14,15,16,17,18]. For example, in 2013, Yuan et al proposed a ZnO thin-film driven microcantilever for nanoscale actuation and sensing based on the radio frequency (RF) magnetron sputtering method, and got a piezoelectric coefficient d 31 of about 4.66 pC/N, in view of the deflection of the cantilever beam tip [13].…”
Section: Introductionmentioning
confidence: 99%