“…The existence of defects, such as Zn interstitial atoms or O atom vacancies, during the preparation of pure ZnO thin films results in ZnO thin films representing as n-type semiconductors. Thus, it is possible to change the conductivity of semiconductor materials with the incorporation of certain impurities (Li, Al, Na, Mg, et al) [14,15,16,17,18]. For example, in 2013, Yuan et al proposed a ZnO thin-film driven microcantilever for nanoscale actuation and sensing based on the radio frequency (RF) magnetron sputtering method, and got a piezoelectric coefficient d 31 of about 4.66 pC/N, in view of the deflection of the cantilever beam tip [13].…”