2023
DOI: 10.1007/s00339-023-06554-9
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Fabrication and electrical surface characterization of pellets of V2O5 nanostructures for robust and portable gas sensor applications

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Cited by 10 publications
(17 citation statements)
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“…003-0397). , The reflection peaks (200) and (001) at 2θ ∼15.35 and ∼20.26°, respectively, correspond to the crystalline phase of the V 2 O 5 active switching layer [JCPDS Card no. 89-2482] . In addition, the XRD peaks (311) and (111) at 2θ ∼50.35 and ∼25.45°, respectively, are related to the NiMnIn bottom electrode. ,, The layer structure was confirmed by plotting the Raman spectra of the sputter-deposited V 2 O 5 active switching layer (Figure c).…”
Section: Resultsmentioning
confidence: 83%
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“…003-0397). , The reflection peaks (200) and (001) at 2θ ∼15.35 and ∼20.26°, respectively, correspond to the crystalline phase of the V 2 O 5 active switching layer [JCPDS Card no. 89-2482] . In addition, the XRD peaks (311) and (111) at 2θ ∼50.35 and ∼25.45°, respectively, are related to the NiMnIn bottom electrode. ,, The layer structure was confirmed by plotting the Raman spectra of the sputter-deposited V 2 O 5 active switching layer (Figure c).…”
Section: Resultsmentioning
confidence: 83%
“…003-0397). 47,48 The reflection peaks . 49 In addition, the XRD peaks (311) and (111) at 2θ ∼50.35 and ∼25.45°, respectively, are related to the NiMnIn bottom electrode.…”
Section: ■ Results and Discussionmentioning
confidence: 99%
“…The schematics of the sensing setup are illustrated in Figure b. The response of the sensor was calculated employing the following formula S = false| ( R R normalo ) false| R normalo × 100 % Where S = sensor response, R = resistance of the sensor in the presence of the target gas, and R o = resistance of the sensor in the presence of air.…”
Section: Methodsmentioning
confidence: 99%
“…The success of expeditions for scientific exploration in these locations crucially depends on the payloads consisting of electronic devices manifesting stable responses under such conditions. Today, researchers focus on materials demonstrating stable device performance for various applications in extreme conditions. , It is usually observed that the highly active materials for some applications suffer from less stability. , For instance, metal oxides, transition-metal dichalcogenides (TMDs), metal nitrides, etc., exhibit high energy storage capability, but their stability in aqueous electrolytes is inferior. , These problems are usually caused by poor adhesion of the active materials to the substrate, loosely bound constituents of the materials, irreversible side product formation during device operation, structural deformations, etc. To overcome this issue, numerous techniques are being incorporated, such as composite and heterojunction formation, binder usage, porous substrates, employing suitable fabrication techniques such as one-step sputtering, etc .…”
Section: Introductionmentioning
confidence: 99%
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