Abstract:We report on characterization of Pd/ZnO nanostructure thin film Schottky contacts based UV photodetector. The ZnO film was grown on p-type Si ‹100› substrate by using vacuum thermal evaporation method. With applied voltage in the range from -2V to 2V we estimated the photocurrent, contrast-ratio, responsivity and quantum-efficiency of the photodetectors for an incident optical power of 0.1mW at 365nm ultraviolet wavelength. The I-V characteristics were studied and the parameters such as idealityfactor, leakage… Show more
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