2021
DOI: 10.1063/5.0040024
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Fabrication and characterization of Mn doped ZnO nanoarrays prepared by two step process

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Cited by 4 publications
(6 citation statements)
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“…The experimentally observed values from this work were found to be between 0.001050 and 0.002028 (nm) -2 for 180 °C and 0.001051 and 0.002509 (nm) -2 for 200 °C respectively. Similar values of this work have been reported by Agarwal et al [6]. The irregular increasing and decreasing trend in values of the dislocation density obtained for this work has been supported by the report of Agarwal et al [6] and Senol et al [33].…”
Section: Dislocation Densitysupporting
confidence: 92%
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“…The experimentally observed values from this work were found to be between 0.001050 and 0.002028 (nm) -2 for 180 °C and 0.001051 and 0.002509 (nm) -2 for 200 °C respectively. Similar values of this work have been reported by Agarwal et al [6]. The irregular increasing and decreasing trend in values of the dislocation density obtained for this work has been supported by the report of Agarwal et al [6] and Senol et al [33].…”
Section: Dislocation Densitysupporting
confidence: 92%
“…Similar values of this work have been reported by Agarwal et al [6]. The irregular increasing and decreasing trend in values of the dislocation density obtained for this work has been supported by the report of Agarwal et al [6] and Senol et al [33]. A decline in dislocation density specifies reduction in the totality of defects in the crystal growth and vice versa [13].…”
Section: Dislocation Densitysupporting
confidence: 91%
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