2010
DOI: 10.1364/oe.18.000773
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Fabrication and characterization of freestanding circular GaN gratings

Abstract: It's of significant interest to combine freestanding nanostructure with active gallium nitride (GaN) material for surface-emitting optoelectronic application. By utilizing bulk micromachining of silicon, we demonstrate here a promising way to fabricate freestanding GaN nanostructures using a GaN-on-silicon system. The well-defined nanoscale circular GaN gratings are realized by fast-atom beam (FAB) etching, and the freestanding GaN gratings are obtained by removing silicon substrate using deep reactive ion etc… Show more

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Cited by 18 publications
(12 citation statements)
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“…Such freestanding metamaterials can be experimentally realized by using undercutting techniques [40], [41]. They are arranged on a square lattice with 350-nm period.…”
Section: Resultsmentioning
confidence: 99%
“…Such freestanding metamaterials can be experimentally realized by using undercutting techniques [40], [41]. They are arranged on a square lattice with 350-nm period.…”
Section: Resultsmentioning
confidence: 99%
“…The z-axis is normal to the structure surface and the x-y plane is parallel to the structure surface. In order to simplify the design, the structures are considered to be suspended in vacuum; deep etching of a silicon support substrate can be used to achieve this [30][31][32][33]. Au is selected as the metal due to its stability and low ohmic loss.…”
Section: Metamaterials Designmentioning
confidence: 99%
“…The starting material, consisting of 200nm GaN layer, 450nm AlGaN layer, 200nm AlN buffer layer and 200µm silicon handle layer, is a 20mm×20mm substrate which is cut from a commercial 4-inch GaN template grown on silicon substrate by metal organic chemical vapor deposition (MOCVD). The InGaN/GaN MQWs active layers are deposited on the GaN template by molecular beam epitaxy (MBE) with radio frequency nitrogen plasma as gas source [20][21][22]. A 90nm buffer layer, which incorporated 6nm AlN layer, twelve-period 3nm AlN/3nm GaN superlattice and 12nm GaN layer, was firstly deposited on the GaN template.…”
Section: Device Fabricationmentioning
confidence: 99%
“…With an etching mask of silica nanospheres, the nanostructure patterns were transferred to the GaN slab by FAB etching [22][23][24], and the residual silica particles were finally removed in buffered HF solution, generating subwavelength nanostructures on the freestanding GaN slab (steps e). Although the freestanding GaN slab has a small downward deflection due to the residual stress [22,24], subwavelength texturing is well conducted in the whole device area. The emission properties of fabricated samples are characterized using a microphotoluminescence (micro-PL) system at room temperature.…”
Section: Device Fabricationmentioning
confidence: 99%