2019
DOI: 10.1109/access.2019.2913620
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Fabric Defect Detection Using Activation Layer Embedded Convolutional Neural Network

Abstract: Loom malfunctions are the main cause of faulty fabric production. A fabric inspection system is a specialized computer vision system used to detect fabric defects for quality assurance. In this paper, a deep-learning algorithm was developed for an on-loom fabric defect inspection system by combining the techniques of image pre-processing, fabric motif determination, candidate defect map generation, and convolutional neural networks (CNNs). A novel pairwise-potential activation layer was introduced to a CNN, le… Show more

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Cited by 92 publications
(50 citation statements)
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“…In this section, the novel nonlinear hypothesis called NNH and second order nonlinear hypothesis called SONH of this document are compared with the nonlinear hypothesis of previous investigations [21], [22] called NH for modeling ; z m ), the parameterized equations of an ELP in three-dimensional space as a function of time t can be written as:…”
Section: Resultsmentioning
confidence: 99%
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“…In this section, the novel nonlinear hypothesis called NNH and second order nonlinear hypothesis called SONH of this document are compared with the nonlinear hypothesis of previous investigations [21], [22] called NH for modeling ; z m ), the parameterized equations of an ELP in three-dimensional space as a function of time t can be written as:…”
Section: Resultsmentioning
confidence: 99%
“…Figure 12 shows the ECP obtained with equation (27). Before the training with equations (4), (6), and α = 1, the initial parameters for the NH are in equation (21), rand is a random number with values between 0 and 1.…”
Section: Resultsmentioning
confidence: 99%
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“…In recent years, convolutional neural networks (CNNs) have shown remarkable outcomes in various computer vision applications. In particular, several networks including FCN [19], SegNet [20], and AdapNet [21] demonstrated a notable performance for semantic segmentation, and thus, deep learning-based approaches have been widely applied to defect inspections [22]- [24].…”
Section: Introductionmentioning
confidence: 99%