2020
DOI: 10.1002/smll.202006765
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Extrinsic Photoconduction Induced Short‐Wavelength Infrared Photodetectors Based on Ge‐Based Chalcogenides

Abstract: 2D layered photodetectors have been widely researched for intriguing optoelectronic properties but their application fields are limited by the bandgap. Extending the detection waveband can significantly enrich functionalities and applications of photodetectors. For example, after breaking through bandgap limitation, extrinsic Si photodetectors are used for short-wavelength infrared or even long-wavelength infrared detection. Utilizing extrinsic photoconduction to extend the detection waveband of 2D layered pho… Show more

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Cited by 29 publications
(42 citation statements)
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“…The obtained dichroic ratio here is compatible with previous polarization‐sensitive photodetectors. [ 10b ] The angle‐dependence of the extrinsic photoconductivity is slightly sample‐dependent, which is attributed to the O 2 intercalation induced disorder and grain reorientation. [ 16a ] The most likely reason for the anisotropy in the photocurrent is anisotropic optical absorption due to the anisotropy on the refractive index.…”
Section: Resultsmentioning
confidence: 99%
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“…The obtained dichroic ratio here is compatible with previous polarization‐sensitive photodetectors. [ 10b ] The angle‐dependence of the extrinsic photoconductivity is slightly sample‐dependent, which is attributed to the O 2 intercalation induced disorder and grain reorientation. [ 16a ] The most likely reason for the anisotropy in the photocurrent is anisotropic optical absorption due to the anisotropy on the refractive index.…”
Section: Resultsmentioning
confidence: 99%
“…The ability to break through the bandgap limitation is of great significance for practical optical and optoelectronic device applications. [ 10 ] A few techniques have already been proposed to broaden the detection waveband of silicon via strain engineering, [ 10a ] the addition of dopants. [ 11 ] While, for 2D semiconductors, the atomic thickness and dangling bonds free surface allow significant bandgap modifications through strain engineering, [ 12 ] defects, [ 10b ] layer number control, [ 13 ] alloying, [ 14 ] as well as intercalation.…”
Section: Introductionmentioning
confidence: 99%
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“…Many factors may influence the growth of high‐quality large‐area 2D materials, such as elemental ratio, surface defects, nucleation processes, growth catalytic techniques, and phase control, require further investigation. Because of the immature state of growth technology, defects are produced in the material: vacancies, substitutions, anti‐sites, and adsorbed atoms 54 . These have a significant influence on the electrical and optoelectronic properties of 2D materials: they can act as carrier donors, scatterers, traps, and recombination centers under different conditions 55 .…”
Section: Challenges Of Two‐dimensional Materials Array Detectorsmentioning
confidence: 99%