2013
DOI: 10.4028/www.scientific.net/ssp.205-206.26
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External and Internal Gettering of Interstitial Iron in Silicon for Solar Cells

Abstract: Abstract. The removal of dissolved iron from the wafer bulk is important for the performance of ptype multicrystalline silicon solar cells. In this paper we review some recent progress in understanding both external and internal gettering of iron. Internal gettering at grain boundaries and dislocations occurs naturally during ingot cooling, and can also be driven further during cell processing, especially by moderate temperature anneals (usually below 700 °C). Internal gettering at intra-grain defects plays ke… Show more

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Cited by 13 publications
(16 citation statements)
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References 30 publications
(53 reference statements)
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“…Therefore, a large fraction of Fe is in precipitated form. Some dissolution of this precipitated Fe is expected during such high temperature processes, 24 however, our previous study 18,25 on neighbouring wafers found that the amount of dissolution is not significant compared to the initial as-cut interstitial Fe concentrations on the order of 10 12 -10 13 cm À3 . It was found that the neighbouring wafers in the as-cut state, either oxidised and removed from the furnace at 1000 C, or oxidised at 1000 C followed by a 10 C/min cool-down to 700 C before being removed from the furnace, all show similar average interstitial Fe concentrations.…”
Section: Methodsmentioning
confidence: 86%
“…Therefore, a large fraction of Fe is in precipitated form. Some dissolution of this precipitated Fe is expected during such high temperature processes, 24 however, our previous study 18,25 on neighbouring wafers found that the amount of dissolution is not significant compared to the initial as-cut interstitial Fe concentrations on the order of 10 12 -10 13 cm À3 . It was found that the neighbouring wafers in the as-cut state, either oxidised and removed from the furnace at 1000 C, or oxidised at 1000 C followed by a 10 C/min cool-down to 700 C before being removed from the furnace, all show similar average interstitial Fe concentrations.…”
Section: Methodsmentioning
confidence: 86%
“…However, our samples are mc-Si. Thus, besides this external gettering, the second sample may also experience internal gettering, in which at least some metal impurities are preferentially decorated around the GBs and sub-GBs instead of being captured in the phosphorus diffused layers [27]. Therefore, although the global concentration of metal impurities such as Fe will be reduced by the external gettering, the local concentration at GBs and sub-GBs could, in principle, actually be higher than that of the as-cut sample.…”
Section: Results and Analysismentioning
confidence: 99%
“…“Red zone” (≈5 cm) in cast mono‐like silicon ingot can be twice as wide as that found in conventional cast mc silicon, which significantly reduce the yield of cast mono‐like silicon ingot. Red zone can reduce the carrier lifetime of p‐type cast mono‐like silicon wafers by more than two orders of magnitude and the material yield (the number of wafers qualified for producing solar cells/the total number of wafers from the red zone of the ingot) by one order of magnitude 57 . As reported, “red zone” is mainly attributed to the iron contamination; however, there are various hypotheses for the detailed mechanisms.…”
Section: Defects In Cast Mono‐like Silicon and Methods To Suppress Themmentioning
confidence: 97%