1989
DOI: 10.1109/20.92422
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Experimental study of the RSFQ logic elements

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1993
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Cited by 74 publications
(18 citation statements)
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“…2 and 3. It has been pointed out before that plasma oscillations in shunted tunnel junction circuits employing active and passive devices can affect circuit behavior [5]. However in those experiments, the passive junction was in series with the shunt resistor, not the active junction, and the phenomena we describe did not occur.…”
Section: Description Of Experimentsmentioning
confidence: 80%
See 1 more Smart Citation
“…2 and 3. It has been pointed out before that plasma oscillations in shunted tunnel junction circuits employing active and passive devices can affect circuit behavior [5]. However in those experiments, the passive junction was in series with the shunt resistor, not the active junction, and the phenomena we describe did not occur.…”
Section: Description Of Experimentsmentioning
confidence: 80%
“…1 using the PARTS process [3]. We measured I-V characteristics of JJs with a significant range of junction sizes (0.5-3 ), shunt resistances (4)(5)(6)(7)(8)(9)(10)(11)(12)(13)(14)(15)(16)(17)(18)(19)(20), and critical current densities (0. ).…”
Section: Description Of Experimentsmentioning
confidence: 99%
“…The escape junctions J1 and J3 shield the SFQ pulse sources from the back reaction in the case of a double set or reset pulse. The pulse stretcher is based on the same concept but now a dc-squid containing junctions J5 and J6 is coupled to the flip-flop [7], [8]. When a signal is applied to the set input, the flip-flop switches to state 1 and the junction J6 is providing a finite dc voltage at the output.…”
Section: A Description Of the Pulse Stretcher Behaviormentioning
confidence: 99%
“…Now we have extended our experimental setup to evaluate basic RSFQ circuits. The circuit under test (CUT), we used throughout our experiment, was a chain consisting of a DC/SFQ converter, a Josephson transmission line (JTL), and an SFQ/DC converter [10]. Instead of the reduction of critical currents an alternative measure for the performance degradation of complex circuits has to be used, which we term error rate.…”
Section: Introductionmentioning
confidence: 99%