Experimental Study of Evaporation in the Contact Line Region of a   Mixture of Decane and 2% Tetradecane

Tung, C. Y.; T, Muralidhar; Wayner, Peter

doi:10.1615/ihtc7.3840

Cited by 4 publications

(4 citation statements)

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“…This was done for the decane/2% tetradecane system using an implicit integration scheme developed by Hindmarsh (1 974) based on the work of Gear (1 97 1). The results are shown in Figures 3 and 4 and are in good agreement with experimental data (Tung, 1982). Figure 4 shows a sharp decrease in curvature near the contact line.…”

Section: Equilibrium Profilesupporting

confidence: 87%

“…The initial conditions used in the two cases were based in part on experimental observations and are given in Table 1. Experimentally (Tung, 1982;Tung et al, 1982), it was found that the temperature data could be represented well by two straight lines intersecting a t a location that corresponded to the contact line region. From the slopes of these straight lines a value of P,, the integral heat sink of the meniscus, is calculated by taking the difference between the heat conducted into and out of the contact line region.…”

Section: Evaporating Meniscusmentioning

confidence: 95%

“…For the case of the evaporating meniscus, the experimental profile data of Tung (1982) are combined with the model outlined above to compute the temperature and composition profiles in the meniscus as well as the evaporative heat flux and mass flow rate as functions of thickness. The experimental profile data are fitted to various polynomials of order m in a least- squares sense.…”

Section: Evaporating Meniscusmentioning

confidence: 99%

“…Sharp (1964) and Voutsinos and Judd (1975) used a similar technique to study the transient process of evaporation of the microlayer in nucleate boiling. In a recent set of publications (Cook et al, 1981;Tung, 1982;Tung et al, 1982;Wayner et al, 1983;Tung and Wayner, 1984;, the use of a scanning microphotometer to help determine the heat transfer characteristics of a thin steady state evaporating liquid film in the thickness range lo-' rm < 6 i m is described. A simple diagram of the system is shown in Figure 1.…”

Section: Introductionmentioning

confidence: 99%

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Surface shear near the contact line of a binary evaporating curved thin film

Parks

Wayner

1987

AIChE Journal

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A model for surface shear in the contact line region of a steady state two-component evaporating thin film in the shape of a meniscus is developed. A constant vapor pressure boundary condition at the liquidvapor interface is combined with experimental meniscus profile data to obtain temperature and composition profiles. The results are used to delineate the relative effects of meniscus shape, temperature, and composition on fluid flow toward the higher temperature in an evaporating meniscus. For the system analyzed, it is found that surface shear due to composition gradients and temperature gradients is the single most important contribution to flow in the evaporating, two-component capillary meniscus in the film thickness range m. The effect of concentration on the vapor pressure leads to a maximum evaporation rate at a thickness of approximately 6 pm for the conditions studied. Theoretical results are discussed in the light of experimental observations. m 5 6 5

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Section: Equilibrium Profilesupporting

confidence: 87%

Section: Evaporating Meniscusmentioning

confidence: 95%

Section: Evaporating Meniscusmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Surface shear near the contact line of a binary evaporating curved thin film

Parks

Wayner

1987

AIChE Journal

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Interfacial Phenomena in Change-of-Phase Heat Transfer: Low Concentration Polymer Solutions

Gerhardt

Wayner

1989

Tribology Transactions

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Interferometry was used to measure rn situ the thickness profiles of evaporatirrg thin films as a function of heat flux for low concentmtion polystyrenelcyclohexane solutions. Evaporative heat Pow rates per unit width of contact line were calculated based on polynomial fits of interference data, combined with a fluid flow model. Tempemture profiles obtained from thermocouple measurements were employed in evcrluating macroscopic interline region heat sink capacities using a one-dimensional heat conductiotz model. Reasonable crgreement between evaporative heat puxes derived from both methods w u established. Pure solvent integral heat fluxes were --'Currently at Wayne State Unlverslty worklng on Ph.D In Chemlcal Englneerlng Presented at the 42nd Annual Meetlng in Anahelm, Callfornia May 11-14,1987 Final manuscript approved August 11, 1988 a = wafer thickness; [m] B = constant, Eq. 3; [N.ni2] g = gravitational acceleration; [m.s-'] AH, = latent heat of vaporization; [J.kg-'1 k = thermal conductivity; [W.m-'.K-I] K = curvature; [ I T -' ] L = order of interference; [dim] m = degrec of polynomial; [dim] M = molecular weight; [kg.mol-I] p = power input; [W] P = pressure; [~. m -' ] pC1 = d" ~s j o l n~n g ' ' pressure; [N.m-'] PlVI = liquid pressure at the vapor-liquid interface; [~. m -~] P.,. = evaporative heat flux per unit width of contact line at contact line; [~. m -~] AP = pressure drop across interface; [N.m-'] Q = evaporative heat flux per unit width of contact line; [~. m -' ] r = reflectivity; [dim] R = radius of curvature; [m] T = temperature; [K]not significantly altered through polylrter addition. Fluid flow toward the triple interline to replace that which evaporuted resulted i n a n apparent non-equilibrium phase separation of concentrated polymer solution from the bulk phase; the sepamtion increased with increasing polymer mulecular weight alrd concentration. A substantial rire in the reflectivity beyond the first interference fringe indicated the possible deposit of a n ultra-thin polymer or polymer solution film.

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