Experimental setup for the measurement of the electrical resistivity and thermopower of thin films and bulk materials

Abstract

Articles you may be interested inNew experimental methodology, setup and LabView program for accurate absolute thermoelectric power and electrical resistivity measurements between 25 and 1600 K: Application to pure copper, platinum, tungsten, and nickel at very high temperatures Rev. Sci. Instrum. 85, 095121 (2014); 10.1063/1.4896046Near room temperature power factor of metal sulfides films AIP Conf.Sample probe to measure resistivity and thermopower in the temperature range of 300 -1000 K Rev. Sci. Instrum. 77, 073904 (2006);

Titanium forms a resonant level in the conduction band of PbTe

“…5 A temperature gradient up to 3K is set on the sample through two small heaters. Two thermocouples measure the generated voltage and the temperature gradient continuously.…”

Improved thermoelectric power measurements using a four-point technique

“…[2,18,19,21,22]. Contact TEP measurements are conventionally measured using a system similar to the schematic shown in Fig.…”

“…Reducing the thermal contact resistance is the simplest way to reduce the random uncertainty in two-point contact TEP measurements, however, for quantitative thermoelectric NDE of materials undergoing subtle material degradation, the required measurement uncertainty demands more effective techniques. It is possible, though particularly practical, to reduce the thermal gradient between the electrodes and the component by heating or cooling both sides of the thermally active electrode so that heat flow through the contact is minimized [18,20]. Alternatively, another approach is to avoid heating or cooling through the sensing contacts altogether, and introduce the temperature gradient by heating remote locations [2,18,19] the importance of this approach has been highlighted in the literature but has not been demonstrated explicitly, the demonstration in this paper is suggested by Ref.…”

“…The accuracy of a two-point TEP measurement is therefore limited by the thermal contact resistance. The importance of thermal contact resistance has long been realized in the design of lab based equipment for measurements on small material samples [2,[17][18][19]. Reducing the thermal contact resistance is the simplest way to reduce the random uncertainty in two-point contact TEP measurements, however, for quantitative thermoelectric NDE of materials undergoing subtle material degradation, the required measurement uncertainty demands more effective techniques.…”

Electrical conductivity measurements on disk-shaped samples

“…The benefits of simultaneous measurements of the thermoelectric properties have long been recognized and therefore many custom-built and commercial measurement systems measure two [1][2][3][4][5][6] or three quantities simultaneously. [7][8][9] Simultaneous measurements reduce measurement time, can decrease measurement errors, and facilitate easy interpretation of the measurement results.…”