2008 15th IEEE International Conference on Electronics, Circuits and Systems 2008
DOI: 10.1109/icecs.2008.4674920
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Experimental methodology for power characterization of FPGAs

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Cited by 2 publications
(2 citation statements)
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“…The power valúes for interconnects are greater than their real valúes in order to compénsate for the increase in static power due to the higher temperature generated by the activity in large designs. Indeed, the results in [21] demónstrate that the XPower errors are below 30% for larger benchmarks implemented on the same platform. Consequently, it seems that low-level tools are suitable for coarse architecture optimization (order of watts), but they are not suitable for power model validation.…”
Section: Measurements Vs Low-level Estimationsmentioning
confidence: 84%
“…The power valúes for interconnects are greater than their real valúes in order to compénsate for the increase in static power due to the higher temperature generated by the activity in large designs. Indeed, the results in [21] demónstrate that the XPower errors are below 30% for larger benchmarks implemented on the same platform. Consequently, it seems that low-level tools are suitable for coarse architecture optimization (order of watts), but they are not suitable for power model validation.…”
Section: Measurements Vs Low-level Estimationsmentioning
confidence: 84%
“…El error de la estimación de consumo es mayor que en el caso de la estimación de área, debido a que por una parte utiliza la propia estimación de área y por otra parte obtiene los datos a partir de las herramientas de Xilinx, que aunque se realizan sobre diseños ya implementados se corresponden con una estimación. A pesar del error cometido, la estimación se obtiene de una manera rápida con la generación del propio core, y por lo tanto necesita muchos menos recursos y tiempo que la obtenida a partir de las herramientas de desarrollo o utilizando medidas experimentales [HASLVE08].…”
Section: Estimación De Consumounclassified