Experimental Evaluation of Material Identification Methods With CdTe X-ray Spectrometric Detector

Rinkel, Jean; Beldjoudi, G.; Rebuffel, V.; Boudou, Caroline; Ouvrier-Buffet, P.; Gonon, G.; Verger, L.; Brambilla, A.

doi:10.1109/tns.2011.2164266

Cited by 24 publications

(18 citation statements)

References 12 publications

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“…Material thicknesses were calculated by dividing the estimated areal densities by the assumed density of the respective material. The density of alpha-phase plutonium, 19.84 [g cm À3 ], is used here. The simulated detector has five energy bins set to line up with the K-edges of the materials assumed to be present.…”

Section: Methodsmentioning

confidence: 99%

“…Radiographic detectors have become available that can measure this spectrum change. [13][14][15][16][17][18][19][20][21] Currently available detectors have pixel arrays of up to 256 Â 256, 16 a pixel pitch of 1 mm or less, up to 256 energy bins that can span an energy range of 20-300 keV, and a maximum count rate of 2.0 Â 10 7 [photons s À1 mm À2 ]. 17 For additional information, see the supplementary material.…”

Section: Introductionmentioning

confidence: 99%

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Non-invasive material discrimination using spectral x-ray radiography

Gilbert

McDonald

Robinson

et al. 2014

Journal of Applied Physics

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Current radiographic methods are limited in their ability to determine the presence of nuclear materials in containers or composite objects. A central problem is the inability to distinguish the attenuation pattern of high-density metals from those with a greater thickness of a less dense material. Here, we show that spectrally sensitive detectors can be used to discriminate plutonium from multiple layers of other materials using a single-view radiograph. An inverse algorithm with adaptive regularization is used. The algorithm can determine the presence of plutonium in simulated radiographs with a mass resolution per unit area of at least 0.07 g cm−2.

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Section: Methodsmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Non-invasive material discrimination using spectral x-ray radiography

Gilbert

McDonald

Robinson

et al. 2014

Journal of Applied Physics

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“…Furthermore, the low intensity of the diffracted signal matches the limitations in flux handling capabilities of the PC detectors, not to mention that the spectral resolution allowed the diffraction experiments to be made with polychromatic laboratory sources. Subsequently, as this next generation of PC detectors could handle higher and higher flux densities (Rinkel et al, 2011), they have moved to the field of tomography (Kheirabadi et al, 2017). For tomography, the energy resolution has been used to improve the handling of beam hardening and to improve material contrast ISSN 1600-5775 # 2018 International Union of Crystallography and for revealing quantitative information about the elemental composition of the absorber in K-edge imaging (Roessl & Proksa, 2007).…”

Section: Introductionmentioning

confidence: 99%

Subpixel resolution in CdTe Timepix3 pixel detectors

Khalil

Dreier

Kehres

et al. 2018

J Synchrotron Radiat

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Timepix3 (256 Â 256 pixels with a pitch of 55 mm) is a hybrid-pixel-detector readout chip that implements a data-driven architecture and is capable of simultaneous time-of-arrival (ToA) and energy (ToT: time-over-threshold) measurements. The ToA information allows the unambiguous identification of pixel clusters belonging to the same X-ray interaction, which allows for full oneby-one detection of photons. The weighted mean of the pixel clusters can be used to measure the subpixel position of an X-ray interaction. An experiment was performed at the European Synchrotron Radiation Facility in Grenoble, France, using a 5 mm Â 5 mm pencil beam to scan a CdTe-ADVAPIX-Timepix3 pixel (55 mm Â 55 mm) at 8 Â 8 matrix positions with a step size of 5 mm. The head-on scan was carried out at four monochromatic energies: 24, 35, 70 and 120 keV. The subpixel position of every single photon in the beam was constructed using the weighted average of the charge spread of single interactions. Then the subpixel position of the total beam was found by calculating the mean position of all photons. This was carried out for all points in the 8 Â 8 matrix of beam positions within a single pixel. The optimum conditions for the subpixel measurements are presented with regards to the cluster sizes and beam subpixel position, and the improvement of this technique is evaluated (using the charge sharing of each individual photon to achieve subpixel resolution) versus alternative techniques which compare the intensity ratio between pixels. The best result is achieved at 120 keV, where a beam step of 4.4 mm AE 0.86 mm was measured.research papers

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“…These systems provide a coarse energy resolution given by a limited number of discriminators and counters. CEA-LETI has developed a read-out circuit that continuously digitizes the signal for each pixel [7], [8]. The 16-channel demonstrator was designed and produced with discrete components.…”

Section: Introductionmentioning

confidence: 99%

“…The proposed architecture, which includes one ADC per pixel, is possible for a linear pixel detector array and can easily be extended to larger sensors. Such sensors can replace standard dual layer sandwich detectors used for explosive detection in luggage inspection, providing much more complete energy information on the X-ray transmission function of inspected materials [8].…”

Section: Introductionmentioning

confidence: 99%