Experimental Demonstration of Higher Precision Weak-Value-Based Metrology Using Power Recycling

Abstract

The weak-value-based metrology is very promising and has attracted a lot of attention in recent years because of its remarkable ability in signal amplification. However, it is suggested that the upper limit of the precision of this metrology cannot exceed that of classical metrology because of the low sample size caused by the probe loss during postselection. Nevertheless, a recent proposal shows that this probe loss can be reduced by the power-recycling technique, and thus enhance the precision of weak-value-based metrology. Here we experimentally realize the power-recycled interferometric weak-value-based beam-deflection measurement and obtain the amplitude of the detected signal and white noise by discrete Fourier transform. Our results show that the detected signal can be strengthened by power recycling, and the power-recycled weak-value-based signal-to-noise ratio can surpass the upper limit of the classical scheme, corresponding to the shot-noise limit. This work sheds light on higher precision metrology and explores the real advantage of the weak-value-based metrology over classical metrology.

Micro-angle attitude measurement technology and research progress based on quantum weak value measurement

“…As shown in Figure 6. In 2016, Wang Y T et al [8] used power recovery technology to measure beam deflection. Through discrete Fourier transform analysis, the amplitude of the signal to be measured and white noise were experimentally obtained, and their losses were reduced.…”

Robust interferometry against imperfections based on weak value amplification

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Signal-recycled weak measurement for ultrasensitive velocity estimation*

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