2017
DOI: 10.1049/iet-pel.2016.0668
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Experimental Comparison of High‐Speed Gate Driver Design for 1.2‐kV/120‐A Si IGBT and SiC MOSFET Modules

Abstract: Silicon carbide (SiC) metal-oxide-semiconductor field-effect transistor (MOSFET) is regarded as an attractive replacement for Si insulated gate bipolar transistor (IGBT) in high-power density applications due to its high switching speed and low switching loss. However, to fully utilise these benefits, the gate driver of the SiC MOSFET needs to be optimised to meet its special driving requirements. Fundamentally, both gate drivers for Si IGBT and SiC MOSFET share similar design methodology since these two power… Show more

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Cited by 41 publications
(14 citation statements)
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References 22 publications
(24 reference statements)
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“…One of the key concerns for end users of IGBT power modules is the power loss characteristics of the devices. Since the traditional silicon (Si) based devices have almost reached their upper limit of power loss optimisation, the wide bandgap (WBG) materials [4][5][6], such as silicon carbide (SiC) and gallium nitride, have been identified as promising alternatives due to their superior material properties, such as higher breakdown voltage level, higher barrier heights, higher operation temperature and higher thermal conductivity.…”
Section: Introductionmentioning
confidence: 99%
“…One of the key concerns for end users of IGBT power modules is the power loss characteristics of the devices. Since the traditional silicon (Si) based devices have almost reached their upper limit of power loss optimisation, the wide bandgap (WBG) materials [4][5][6], such as silicon carbide (SiC) and gallium nitride, have been identified as promising alternatives due to their superior material properties, such as higher breakdown voltage level, higher barrier heights, higher operation temperature and higher thermal conductivity.…”
Section: Introductionmentioning
confidence: 99%
“…The design aspects that must be considered from the point of view of the gate driver are presented in [12][13][14], with the aim of reducing the switching time without increasing electromagnetic interference (EMI).…”
Section: Introductionmentioning
confidence: 99%
“…It may lead to parasitic effects including phase-leg crosstalk and electromagnetic interference (EMI) issues due to the ringings, which are where the early works mainly focused on. To summarize, the gate driver design for SiC MOSFET should follow such rules [9][10][11][12]:…”
Section: Introductionmentioning
confidence: 99%