Experimental and Theoretical Examination of Field Emission in Surface Conduction Electron-Emitter Displays

High field emission efficiency surface conduction electron emitters

“…According to the calibrated model and the experimental data [8][9][10][11][12], Fig. 4 shows the current-voltage (I-V) characteristics for the sample with 90 nm nanogap by two fabricated methods, where the Vg varies from 0 V to 300 V. The solid line indicates the data of FIB technique, the dashed-line is the HE results, and symbols are calibrated data.…”

“…We first use two methods to fabricate 90 nm nanogap in the palladium (Pd) thin-film strips. One is formed by FIB technique and the other is by hydrogen embrittlement [8][9][10][11][12]. All process steps are compatible with contemporary integrated circuit technology.…”

“…We first formulate a calibrated model with the experimental data by using the numerical simulation [10][11][12]. The computational flowchart of FDTD-PIC simulation is shown in Fig.…”

“…In this work, two structures of SCEs fabricated by hydrogen embrittlement (HE) [8] and focused ion beam (FIB) technique [9][10][11][12] with the separation of 90 nm wide have been investigated computationally. The calibrated model is performed by a 3D FDTD-PIC simulation for self-consistent solution of the electromagnetic fields and charged particles.…”