1993
DOI: 10.1088/0268-1242/8/12/017
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Excitonic photoluminescence in high-purity InAs MBE epilayers on GaAs substrates

Abstract: Temperature-and excitation-dependent photoluminescence measurements have been carried out on 0.7-5 um thick heteroepitaxial InAs layers grown by molecular beam epitaxy (MBE). Excitonic photoluminescence with linewidths down to 5 meV reveals t h e high optical quality of t h e epilayers despite t h e 7",,, mismatch between the lnAs and the GaAs substrates. Peaks at 403 and 391 meV, which quench rapidly with increasing temperature, are attributed to bound excitons, and a sharp (7 meV FWHM) intense line at 417 me… Show more

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Cited by 31 publications
(15 citation statements)
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“…However B-B transitions were reported by Lacroix et al [12] at around 0.415 eV (at 1.4 K) for InAs grown by metal organic chemical vapour deposition (MOCVD). The free exciton transition has also been reported by Tang et al [13] for MBE grown InAs at around 0.417 eV (at 11 K). Two impurity-related transitions, a shallow and a deep donor bound exciton at 0.414 eV [13] and 0.403 eV [14], respectively, have been observed for MOCVD-grown (n ~510 15 cm -3 ) and MBE-grown (n ~510 14 cm -3 ) n-InAs.…”
Section: Introductionsupporting
confidence: 74%
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“…However B-B transitions were reported by Lacroix et al [12] at around 0.415 eV (at 1.4 K) for InAs grown by metal organic chemical vapour deposition (MOCVD). The free exciton transition has also been reported by Tang et al [13] for MBE grown InAs at around 0.417 eV (at 11 K). Two impurity-related transitions, a shallow and a deep donor bound exciton at 0.414 eV [13] and 0.403 eV [14], respectively, have been observed for MOCVD-grown (n ~510 15 cm -3 ) and MBE-grown (n ~510 14 cm -3 ) n-InAs.…”
Section: Introductionsupporting
confidence: 74%
“…The free exciton transition has also been reported by Tang et al [13] for MBE grown InAs at around 0.417 eV (at 11 K). Two impurity-related transitions, a shallow and a deep donor bound exciton at 0.414 eV [13] and 0.403 eV [14], respectively, have been observed for MOCVD-grown (n ~510 15 cm -3 ) and MBE-grown (n ~510 14 cm -3 ) n-InAs. Note that the formation of excitons typically occurs for free electron concentrations below the Mott screening density (~510 14 cm -3 ) [15].…”
Section: Introductionsupporting
confidence: 74%
See 1 more Smart Citation
“…For example, barrier detector current responsivity at small bias usually approaches zero; as a result, normally, the figure of merit is the dark current at a curtain bias and not the value of R o A . The 233 K dark current value J dark in our PDs was several times smaller than that in InAsSb 0.4 barrier photodiodes at U = −0.45 V with similar spectral response and was ≈10 times higher than the values derived from the “Rule 07” directives . Shown in Figure is the temperature dependence of the J dark /T 3 ratio at biases of −0.1 and −0.4 V, where the term T 3 accounts for the temperature dependence of the density of states in the expression for the diffusion current density .…”
Section: Resultsmentioning
confidence: 58%
“…). For InAsSb‐based structures, the above property is believed to be enabled by their unique property of producing electronic states above the conduction band, thereby suppressing the Shockley–Read–Hall recombination processes . There is thus a good chance for manufacturing efficient PDs for radiation detection at wavelengths exceeding 6 µm by using lattice mismatched substrates, e.g., InAs substrates for the InAs 1− x Sb x /InAs ( x > 0.2, Δa/a > 0.015) heterostructure PDs.…”
Section: Introductionmentioning
confidence: 99%