We report on the dephasing dynamics of exciton fine structure (EFS) in a free standing GaN. The EFS was observed and studied by utilizing a four‐wave‐mixing (FWM) spectroscopy. In the cleavage plane of wurtzite GaN, we can excite the B‐exciton fine structure, whose z ‐polarized state is energetically well separated from the other in‐plane polarized exciton states. Due to the large spin exchange interaction in GaN, an energy shift of in‐plane polarized fine structure was also observed.
Since the each component of EFS is highly polarized, the polarization‐dependent FWM successfully resolves their dephasing dynamics. The results show a significant difference in the dephasing time between EFS, suggesting that anisotropic exchange interaction is effective as reported in our previous work using a GaN film on a ‐plane sapphire (© 2009 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)