In this study, we
report highly efficient and flexible photosensors with GaN nanowires
(NWs) horizontally embedded in a graphene sandwich structure fabricated
on polyethylene terephthalate. GaN NWs and the graphene sandwich structure
are used as light-absorbing media and the channel for carrier movement,
respectively. To form uniform high-quality crystalline GaN NWs on
Si(111) substrates, the initial nucleation behavior of the NWs was
manipulated by applying the new growth technique of Ga predeposition.
High-resolution transmission electron microscopic images obtained
along the vertical direction of GaN NWs showed that stacking faults,
typically observed in Si-based (In,Ga)As NWs, were rare. Consequently,
narrow and strong optical emission was observed from the GaN NWs at
wavelengths of 365.12 nm at 300 K. The photocurrent and photoresponsivity
of the flexible photosensor with 802 nm long GaN NWs horizontally
embedded in the graphene sandwich channel were measured as 9.17 mA
and 91.70 A/W, respectively, at the light intensity of 100 mW/cm2, which are much higher than those previously reported. The
high optical-to-electrical conversion characteristics of our flexible
photosensors are attributed to the increase in the effective interface
between the light-absorbing media and the carrier channel by the horizontal
distribution of the GaN NWs within the graphene sandwich structure.
After 200 cyclic-bending test of the GaN NW photosensor at the strain
of 3%, the photoresponsivity under strain was measured as 89.04 A/W
at 100 mW/cm2, corresponding to 97.1% of the photoresponsivity
obtained before bending. The photosensor proposed in this study is
relatively simple in device design and fabrication, and it requires
no sophisticated nanostructural design to minimize the resistance
to metal contacts.