2010
DOI: 10.3116/16091833/11/4/269/2010
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Ex-situ ellipsometric study of the nanolayers of dihydroantracene oligoperoxide adsorbed on glass surface

Abstract: In this work we study kinetics of adsorption process and structure of nanolayers formed by a new oligoperoxide with dihydroantracene units. It is shown that the structure of oligoperoxide nanolayer adsorbed on a glass surface depends on the concentration of polymer in aqueous solution and the duration of adsorption process. The adsorption isotherm curves reveal a complicated time dependences explained by changes occurring in the conformation of macromolecules on the solid surface. A stable equilibrium of the s… Show more

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Cited by 3 publications
(2 citation statements)
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“…In this relation we are to notice that readily detectable changes of the ellipsometric parameters for a system of transparent film and substrate can appear even in the case of extremely low-contrast monomolecular layers deposited using controlled grafting [5,[24][25][26]. These changes in the optical response can be explained when taking into account the influence of inhomogeneous surface layers appearing at the substrate surfaces [27,28].…”
Section: Introductionmentioning
confidence: 92%
“…In this relation we are to notice that readily detectable changes of the ellipsometric parameters for a system of transparent film and substrate can appear even in the case of extremely low-contrast monomolecular layers deposited using controlled grafting [5,[24][25][26]. These changes in the optical response can be explained when taking into account the influence of inhomogeneous surface layers appearing at the substrate surfaces [27,28].…”
Section: Introductionmentioning
confidence: 92%
“…However, the alignment of the typical ellipsometer is rather large in size and difficult to modify to comply with certain works. In this work, we design and set up a computer-interface ellipsometer that has relatively smaller size than that of commercial ones and can be easily modified for several specific works including surface analysis [12,13]. Such ellipsometer can also be incorporated into deposition systems so that the thickness of thin film may be monitored in real time during the deposition.…”
Section: Introductionmentioning
confidence: 99%