2019
DOI: 10.1007/s11051-019-4466-9
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Evolution of nanocrystal size distribution in porous silicon nanoparticles during storage in aqueous media: X-ray diffraction analysis

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Cited by 6 publications
(6 citation statements)
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“…In order to characterize the crystalline nature of the nPSi microparticles embedded into the hydrogels, samples were analyzed by X-ray diffraction (XRD) (Figure 4C). Diffractogram of nPSi revealed their characteristic peaks of Si corresponding to the (111), (220), and (311) crystallographic plane at 27.9º, 46.6º and 55.2º, respectively [32]. The low intensity and high broadness of the peaks is due to the small nanocrystallite size in nanoporous dust, in agreement with previously inside nPSi sponge structures [32].…”
Section: Resultssupporting
confidence: 87%
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“…In order to characterize the crystalline nature of the nPSi microparticles embedded into the hydrogels, samples were analyzed by X-ray diffraction (XRD) (Figure 4C). Diffractogram of nPSi revealed their characteristic peaks of Si corresponding to the (111), (220), and (311) crystallographic plane at 27.9º, 46.6º and 55.2º, respectively [32]. The low intensity and high broadness of the peaks is due to the small nanocrystallite size in nanoporous dust, in agreement with previously inside nPSi sponge structures [32].…”
Section: Resultssupporting
confidence: 87%
“…Diffractogram of nPSi revealed their characteristic peaks of Si corresponding to the (111), (220), and (311) crystallographic plane at 27.9º, 46.6º and 55.2º, respectively [32]. The low intensity and high broadness of the peaks is due to the small nanocrystallite size in nanoporous dust, in agreement with previously inside nPSi sponge structures [32]. However, when nPSi was embedded into hydrogels, peaks slightly shifted to higher two theta values, and the intensity of peaks increased according to nPSi concentration.…”
Section: Resultsmentioning
confidence: 99%
“…The broadening of peaks is attributed to the presence of a significant number of small individual crystallites, the size of which can be evaluated using the Scherrer equation: where λ is the wavelength of X-ray radiation (λ = 0.154184 nm for our case), K is a dimensionless shape factor close to unity, Δ θ is an FWHM line broadening, and θ is a Bragg angle of the corresponding crystallographic plane. Equation (2) allows us to estimate the value of = 10–12 nm, which agrees with early published results for the m-PSi [ 50 ].…”
Section: Resultssupporting
confidence: 86%
“…The periodic order of reflexes in the pattern points to the crystalline structure of silicon remained after the processes of etching and ball milling [ 49 ]. Panoramic XRD patterns for crystalline silicon (c-Si) and m-PSi NPs powders given in Figure S2 of Supplementary Materials demonstrate a low fraction of amorphous SiO 2 phase in m-PSi NPs (measured as a ratio between background signal and peak intensity) and preservation of silicon crystalline structure [ 50 ]. The broadening of peaks is attributed to the presence of a significant number of small individual crystallites, the size of which can be evaluated using the Scherrer equation: where λ is the wavelength of X-ray radiation (λ = 0.154184 nm for our case), K is a dimensionless shape factor close to unity, Δ θ is an FWHM line broadening, and θ is a Bragg angle of the corresponding crystallographic plane.…”
Section: Resultsmentioning
confidence: 99%
“…Both Si/rGO composites show next to the amorphous rGO structure several Si specific crystalline reflexes, e.g., at 28.3°( 111), 47.2°(220) and 56.1°(311). 29,30 With increasing Si content, the reflex intensity rises. The XRD pattern of the used Si nanoparticles is also shown in Fig.…”
Section: = ( ̇( ) + ̇( )) [ ]mentioning
confidence: 99%