Evolution of dislocation substructure in vapour-deposited lead films on glass substrates

Chatterjee, P.; Gupta, S. P. Sen

doi:10.1080/0141861031000061701

Cited by 3 publications

(2 citation statements)

References 19 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…In the case of the annealed sample the dislocation density from either method is in close agreement, which is in accordance with the µ value of 2.25, indicating a random dislocation distribution. It was earlier shown by Chatterjee and Sen Gupta [28] that the WA and Williamson-Smallman formalisms yield different values of ρ compared to the modified WA procedure for more correlated dislocation distributions µ < 1.…”

Section: Resultsmentioning

confidence: 96%

Microstructural investigation in plastically deformed and annealed copper using a microstructural model

Dey¹,

Chatterjee²,

Gupta³

2005

J. Phys. D: Appl. Phys.

View full text Add to dashboard Cite

Cold-worked and annealed copper powder are investigated in terms of realistic microstructural models based on the strain field model of dislocations and log-normal distribution of spherical crystallites. The dislocation type was observed to be either screw type or ⟨100⟩ type dipoles in cold-worked powder and edge type in annealed powder specimens, respectively. Dislocations are observed to be more correlated in the cold-worked state compared to the annealed state. Systematic differences exist in the mean square strain values for different crystallographic directions, indicating the importance of model-based approaches in analysing dislocation induced x-ray line broadening. For more correlated dislocation distribution model-based approaches should be adopted.

show abstract

Section: Resultsmentioning

confidence: 96%

Microstructural investigation in plastically deformed and annealed copper using a microstructural model

Dey¹,

Chatterjee²,

Gupta³

2005

J. Phys. D: Appl. Phys.

View full text Add to dashboard Cite

show abstract

“…Experimental results indicate that the stability of FCC Ti in thin films is related to the film thickness, surface orientation, and temperature [9][10][11][12][13][14] . The HCP to FCC phase transformation in Ti is dominated by the high density of dislocations and twins introduced by ball milling but not stacking faults 15 . Another experiment observed small amounts of FCC Ti after ball milling Ti-Al powders.…”

Section: Introductionmentioning

confidence: 98%

Deformation Behavior of Pure Titanium With a Rare HCP/FCC Boundary: An Atomistic Study

et al. 2020

View full text Add to dashboard Cite

The compressive and tensile behaviors in a Ti nanopillar with a biphasic hexagonal close-packed (HCP) /face-centered cubic (FCC) phase boundary are theoretically researched using classic molecular dynamic simulation. The results indicate that the HCP/FCC interface and free surface of the nanopillar are the sources of dislocation nucleation. The plastic deformation is mainly concentrated in the metastable FCC phase of the biphasic nanopillar. Under compressive loading, a reverse phase transformation of FCC to the HCP phase is induced by the dislocation glide of multiple Shockley partial dislocations 1 6 <121> under compressive loading. However, for tensile loading a large number of Lomer-Cottrell sessile dislocations and stacking fault nets are formed when the partial dislocations react, which leads to an increase in stress. The formation mechanism of a Lomer-Cottrell sessile dislocation is also studied in detail. Shockley partial dislocations are the dominant mode of plastic deformation behaviors in the metastable FCC phase of the biphasic nanopillar.

show abstract

Dislocation induced line-broadening in cold-worked Pb-Bi binary alloy system in the α-phase using X-ray powder profile analysis

2003

View full text Add to dashboard Cite

Evolution of dislocation substructure in vapour-deposited lead films on glass substrates

Cited by 3 publications

References 19 publications

Microstructural investigation in plastically deformed and annealed copper using a microstructural model

Microstructural investigation in plastically deformed and annealed copper using a microstructural model

Deformation Behavior of Pure Titanium With a Rare HCP/FCC Boundary: An Atomistic Study

Dislocation induced line-broadening in cold-worked Pb-Bi binary alloy system in the α-phase using X-ray powder profile analysis

Contact Info

Product

Resources

About