Evolution of concentration profiles in Pd–Cu systems studied by SNMS technique

Molnár, G.; Erdélyi, Zoltán; Langer, G.A.; Beke, Dezső L.; Csík, A.; Katona, G.L.; Daróczi, Lajos; Kis-Varga, M.; Dudas, Alan

doi:10.1016/j.vacuum.2013.04.015

Cited by 14 publications

(20 citation statements)

References 19 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…We did not observe any phase formation after annealing neither in hydrogen atmosphere, nor under vacuum 10 6 Pa. In accordance with the results of [14,[27][28][29], the observations cannot be understood as a planar layer reaction, thus no continuous reaction layer is formed at the original interface.…”

Section: Resultssupporting

confidence: 85%

“…The interdiffusion is often accompanied with the formation of the compound phases [11][12][13]. As an example, in the Cu/Pd system, it was observed by transmission electron microscopy (TEM) that the original interface between the Cu and Pd layers remained clearly visible at 473 K, but the selected area diffraction patterns in TEM indicated the presence of the PdCu phase in GBs [14].…”

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Low-Temperature Interdiffusion and Ordered Phase Formation in Au/Cu Nanocrystalline Thin Films at the Different Atmospheres

Tynkova¹,

Sidorenko²,

Kotenko³

et al. 2016

Metallofiz. Noveishie Tekhnol.

View full text Add to dashboard Cite

Interdiffusion processes in the polycrystalline Au (30 nm)/Cu (40 nm) thin films during annealing at 100-200C for 15 and 30 min in a vacuum with different residual-atmosphere pressures of 10 2 and 10 6 Pa and in an environment of hydrogen at a pressure of 510 2 Pa are investigated. Secondary neutral mass spectrometry complemented with transmission electron microscopy, X-ray diffraction, and atomic force microscopy is used. The intermixing of two layers is observed at the temperatures, at which the bulk diffusion can be safely ruled out. Within the Au layer, the detected Cu profiles and their time evolution are typical C-kinetic regime grain boundary profiles. Due to the much higher grain boundary diffusivity, the saturation of Au grain boundaries at the Au-rich side is hit in a very short time. The high Cu concentration level in the Au-side could be interpreted by supposing existing boundaries, which are moving and leaving behind themselves the areas with high Cu concentration close to the stoichiometric compositions. Phase formation takes place in and around grain boundaries due to diffusing component transport along moving grain boundaries.Досліджено процеси взаємної дифузії в тонких полікристалічних плівках Au (30 нм)/Cu (40 нм) під час відпалу за температур у 100-200С впро-довж 15 і 30 хв. у вакуумі при різних тисках залишкової атмосфери у 10 2 і 10 6 Па та в середовищі водню при значенні тиску у 510 2 Па. Застосовано методу мас-спектрометрії вторинних нейтральних частинок, доповнену трансмісійною електронною мікроскопією, Рентґеновою дифракцією й атомно-силовою мікроскопією. Перемішування двох шарів спостерігало-ся при температурах, за яких повністю виключається дифузія за об'ємним механізмом. Одержані для шару Au профілі Cu та їх еволюція з часом були типовими профілями C-кінетичного режиму зерномежової Па. Использован метод масс-спектрометрии вторичных нейтральных ча-стиц, дополненный трансмиссионной электронной микроскопией, рент-геновской дифракцией и атомно-силовой микроскопией. Перемешивание двух слоёв наблюдалось при температурах, при которых объёмная диф-фузия полностью исключается. Измеряемые для слоя Au профили Cu и их развитие с течением времени были типичными профилями зерногранич-ной диффузии с кинетикой C-типа. Из-за гораздо более высокой зерногра-ничной диффузионной подвижности в обогащённом слое Au насыщение границ зёрен золота достигается за очень короткое время. Высокий уро-вень концентрации Cu в слое Au можно объяснить, предполагая наличие подвижных границ, которые оставляют позади себя области с высокой концентрацией Cu, близкой к стехиометрическому составу. Фазообразо-вание происходит внутри и вокруг границ зёрен посредством перемеще-ния диффундирующего компонента вдоль движущихся границ зёрен.

show abstract

Section: Resultssupporting

confidence: 85%

Section: Introductionmentioning

confidence: 99%

Low-Temperature Interdiffusion and Ordered Phase Formation in Au/Cu Nanocrystalline Thin Films at the Different Atmospheres

Tynkova¹,

Sidorenko²,

Kotenko³

et al. 2016

Metallofiz. Noveishie Tekhnol.

View full text Add to dashboard Cite

show abstract

“…In our previous paper the interdiffusion in Pd-Cu thin film system was investigated in the temperature range of 120°C-310°C [7]. We have shown-in agreement with the experimental observations of [6] too-that the saturation of GBs in Cu was reached in very short times (in the early stages of the process), while we were able to determine the GB diffusion coefficient of Cu in Pd.…”

Section: Introductionsupporting

confidence: 87%

“…It can be seen from figures 3(b) and (d) that again the systems approached to the expected CuPd and Cu 3 Pd final compositions, but obviously during much shorter times. In contrast to our previous work [7], where only SNMS depth profiling was applied, XRD was also used to identify the growing phases. Figure 4 shows the XRD pattern of the 37.5 nm(Pd)/30 nm(Cu) film.…”

Section: Resultsmentioning

confidence: 99%

“…In DIGM the grain boundaries move perpendicular to the original boundary plane and leave an alloyed zone behind. Furthermore it was also illustrated [5][6][7][8][9][10][11][12] that complete homogenization of bilayered films can also happen by formations of reaction products along the grain boundaries, (grain boundary diffusion induced reaction, GBDIREAC [4]). The most important difference, as compared to the well-investigated cases of DIGM/DIR in systems forming solid solutions, lies in the formation of new phases.…”

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Low temperature homogenization in nanocrystalline PdCu thin film system

Molnár

Katona

Langer

et al. 2015

Mater. Res. Express

View full text Add to dashboard Cite

AbstactDiffusion and solid state reactions were investigated in Pd-Cu nanocrystalline films by means of secondary neutral mass spectrometry depth profiling technique. The heat treatments were made at low temperatures (where the volume diffusion was frozen in) for long enough annealing times to reach saturation. In the early stage there is a grain boundary interdiffusion. At longer times first a Pd plateau developed inside the Cu layer. Later on the Cu penetration was also more and more extended in the Pd, even the average composition of Cu in Pd became higher than the average Pd composition in Cu. Depending on the ratio of the initial thicknesses, the system (for thickness ratios corresponding to 50/50 Cu/Pd or to 75/25 Cu/Pd) arrived either at the mixture of pure Pd and β-CuPd phase or to the mixture of α′-Cu 3 Pd and β-CuPd phases, respectively, as dictated by the phase diagram. The process is interpreted as grain boundary diffusion induced solid state reaction.

show abstract

Grain boundary diffusion induced reaction layer formation in Fe/Pt thin films

et al. 2013

Self Cite

View full text Add to dashboard Cite

The solid-state reaction in Pt(15 nm)/Fe(15 nm) and Pt(15 nm)/Ag(10 nm)/Fe(15 nm) thin films after postannealing at 593 K and 613 K for different annealing times has been studied. The structural properties of these samples were investigated by various methods including depth profiling with secondary neutral mass spectrometry, transmission electron microscopy, and X-ray diffraction. It is shown that after annealing at the above temperatures where the bulk diffusion processes are still frozen, homogeneous reaction layers of FePt and FePt with about 10 at.% Ag, respectively, have been formed. Corresponding depth profiles of the element concentrations revealed strong evidence that the formation mechanism is based on a grain boundary diffusion induced solid-state reaction in which the reaction interfaces sweep perpendicularly to the original grain boundary. Interestingly, X-ray diffraction indicated that in both thin-film systems after the solid-state reaction the ordered L1 0 FePt

show abstract

Evolution of concentration profiles in Pd–Cu systems studied by SNMS technique

Cited by 14 publications

References 19 publications

Low-Temperature Interdiffusion and Ordered Phase Formation in Au/Cu Nanocrystalline Thin Films at the Different Atmospheres

Low-Temperature Interdiffusion and Ordered Phase Formation in Au/Cu Nanocrystalline Thin Films at the Different Atmospheres

Low temperature homogenization in nanocrystalline PdCu thin film system

Grain boundary diffusion induced reaction layer formation in Fe/Pt thin films

Contact Info

Product

Resources

About