2013
DOI: 10.1016/j.surfcoat.2012.03.074
|View full text |Cite
|
Sign up to set email alerts
|

Evolution of composition, microstructure and optical properties of yttrium oxide thin films with substrate temperature

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
5

Citation Types

1
12
0

Year Published

2014
2014
2023
2023

Publication Types

Select...
8

Relationship

0
8

Authors

Journals

citations
Cited by 39 publications
(13 citation statements)
references
References 40 publications
1
12
0
Order By: Relevance
“…Y 2 O 3 recently received significant attention by the scientific and research community mainly due to the excellent physical and chemical properties [1,2]. These properties lead to potential applications of Y 2 O 3 based materials in various scientific and technological fields [1,2].…”
Section: Introductionmentioning
confidence: 99%
See 2 more Smart Citations
“…Y 2 O 3 recently received significant attention by the scientific and research community mainly due to the excellent physical and chemical properties [1,2]. These properties lead to potential applications of Y 2 O 3 based materials in various scientific and technological fields [1,2].…”
Section: Introductionmentioning
confidence: 99%
“…These properties lead to potential applications of Y 2 O 3 based materials in various scientific and technological fields [1,2]. Luminescence observed from thin films plays an important role in the development of different luminescent thin film devices such as solar cells, flat-panel displays, light source and integrated optics systems [3].…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…Y 2 O 3 has been regarded as one of the most promising candidates for the dielectric for AOS TFTs devices as a consequence of its particular physical properties, such as thermally and chemically stable, low leakage current, high refractive index (~2), wide band gap (5.5eV), relatively high dielectric constant (14~18), and relatively high band offsets (2.3eV) with respect to silicon [12,13]. Several techniques have been employed to fabricate the Y 2 O 3 thin films, including sputtering [10,[15][16][17][18][19][20][21], solution process [11-12, 14, 18], pulsed laser deposition [13,22], molecular beam epitaxy [23], atomic layer deposition [24], ion beam assisted deposition [25], plasma-enhanced chemical vapor deposition [26], and electron-beam deposition [27]. Among these deposition techniques, solution process may reduce equipment costs, decrease the surface roughness, and increase the uniformity of the thin films [12].…”
Section: Introductionmentioning
confidence: 99%
“…9) Therefore, these devices require preparing films directly on a glass or an organic substrate. 10) Several methods have been used to prepare Y 2 O 3 :Eu 3+ films such as: magnetron sputtering, 11), 12) vacuum nano-imprint, 13) microwave electron cyclotron resonance plasma, 14) sputtering, 15) excimer-laser-assisted metal organic deposition, 16) chemical bath deposition, 17) CVD, 18), 19) electrodeposition 20), 21) or pulsed laser deposition. 22), 23) However, these techniques usually require expensive and complicated equipment setup.…”
Section: Introductionmentioning
confidence: 99%