Evaporated films of stearic acid studied by x-ray diffraction

The high-frequency dielectric constant of evaporated fatty acid films

“…At first sight, the difference in ~p values may be ascribed to their respective odd and even places in the fatty acid series CnH2n+lCOOH. But this seems unlikely when these data are combined with Ef of stearic acid films (E 2.7699) reported earlier by Agarwal and Ichijo (1977). Obviously, in these three consecutive acids (n=l5, 16 and 17), the Ef values are found to increase with increasing number of C atoms (or CHz groups) and they differ only in their second decimal place.…”

“…The theory of the varying gap immersion method described in detail elsewhere (Agarwal and Ichijo 1977), had shown that different formulations can be used depending upon the relative magnitudes of E of the glass substrate (E&, the dielectric liquid (€1) and the film (q). In the present case, when Ef < €1 and E~ > €1, the dielectric constant of the film is given by…”

Realization of Superhydrophobic Surface for the Detection of Residual Detergent Concentration

“…All of the peaks are assigned to crystal planes of wurtzite ZnO, and the strongest one is indexed to the (002) plane, which is the same as for as-synthesized ZnO nanorods. There are no characteristic peaks found for stearic acid since its main peaks supposedly appear below 21°. , The nonhorizontal baseline and a broad hump centered at 2θ = 23.6° may originate from the amorphous glass substrate.…”

“…There are no characteristic peaks found for stearic acid since its main peaks supposedly appear below 21°. 34,35 The nonhorizontal baseline and a broad hump centered at 2θ = 23.6°may originate from the amorphous glass substrate.…”

X-ray diffraction

“…As was mentioned in the previous review in Analytical Chemistry (123), a symposium entitled "Instruments for Tomorrow's Crystallography" was held at the winter meeting of the American Crystallographic Association, January 19-23, 1976 (34), at which time three emerging areas were considered to hold special promise: (1) the use of synchrotron radiation, (2) energy-dispersive diffractometry using solid-state detectors, and (3) the utilization of position-sensitive radiation detectors in x-ray diffraction instrumentation.…”