1974
DOI: 10.1016/0039-6028(74)90094-6
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Evaluation of surface kinetic data by the transform analysis of modulated molecular beam measurements

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Cited by 156 publications
(21 citation statements)
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“…Foxon et al [12] and Foxon and Joyce [13,14] extended this approach by using periodic modulation, combined with signal averaging to obtain statistically significant data. By Fourier transforming the detected signal and the time dependence of the incident flux, the attenuation and phase shift of the Fourier components of this flux due to all events between beam modulation and detection could be obtained.…”
Section: Historical Backgroundmentioning
confidence: 98%
“…Foxon et al [12] and Foxon and Joyce [13,14] extended this approach by using periodic modulation, combined with signal averaging to obtain statistically significant data. By Fourier transforming the detected signal and the time dependence of the incident flux, the attenuation and phase shift of the Fourier components of this flux due to all events between beam modulation and detection could be obtained.…”
Section: Historical Backgroundmentioning
confidence: 98%
“…calculated by the convolution of the ''chopper function'' C(t), which is given by the geometry of the experiment, the Maxwellian flight time distribution between chopper and crystal M 1 (t) and the flight time distribution between crystal and ion source M 2 (t) [16,58], shows a good correspondence to the experimental pulse without the necessity to introduce an additional surface function. This can be seen also when the above experimental pulse is compared with a pulse I 0 (t) with a definitely immeasurable time delay recorded at a high crystal temperature.…”
Section: Molecular Beam Pulse Experimentsmentioning
confidence: 99%
“…The MBE systems used in early surface kinetic studies (54)(55)(56)(57) were single UHV chambers with one or more source ovens, a substrate holder that could be heated to temperatures above 600°C, and a minimum of surface analysis capability, typically Auger electron spectroscopy (AES). A major advance was made when reflection high-energy electron diffraction (RHEED) apparatus was included in the growth chamber to allow real-time observations of the film structure.…”
Section: Molecular Beam Epitaxymentioning
confidence: 99%