2017 IEEE 18th Workshop on Control and Modeling for Power Electronics (COMPEL) 2017
DOI: 10.1109/compel.2017.8013330
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Evaluation of GaN transistor losses at MHz frequencies in soft switching converters

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Cited by 35 publications
(11 citation statements)
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“…More recently, state-of-the-art D-R DS,ON test design has been focusing on the continuous switching method where the GaN devices are switched to the steady-state in power converters, including half-bridge topology [78], [90], [96], buck converter [83], [97], resonant converter [85], [98], etc. With the realistic application profile, steady-state continuous switching test is the best practice to perform a D-R DS,ON characterization.…”
Section: Characterization Methods and Resultsmentioning
confidence: 99%
“…More recently, state-of-the-art D-R DS,ON test design has been focusing on the continuous switching method where the GaN devices are switched to the steady-state in power converters, including half-bridge topology [78], [90], [96], buck converter [83], [97], resonant converter [85], [98], etc. With the realistic application profile, steady-state continuous switching test is the best practice to perform a D-R DS,ON characterization.…”
Section: Characterization Methods and Resultsmentioning
confidence: 99%
“…It has been found [13,14,24] that for many commercial GaN switches operating at hundreds of volts and MHz frequencies, the dc conduction resistance should be scaled by a factor, yielding an appropriate value for dynamic that may be 3-6 times the dc room temperature on-state resistance value. It is also known that at sufficiently high frequencies, output capacitance loss of GaN switches may be important even under ZVS operating conditions [25,26], but for our operating conditions (up to few MHz operation) it is believed that dynamic is the dominant loss concern [24].…”
Section: A Switch Lossmentioning
confidence: 96%
“…Resonant gating techniques can reduce the driving losses [31]- [33]. Under certain voltage and frequency conditions, the resonant charging/discharging process of the switching device's junction capacitor C oss could generate significant power losses [34]- [36].…”
Section: Comparison Of Zvs Resonant Invertersmentioning
confidence: 99%