2018
DOI: 10.3390/electronics7110312
|View full text |Cite
|
Sign up to set email alerts
|

Evaluation by Neutron Radiation of the NMR-MPar Fault-Tolerance Approach Applied to Applications Running on a 28-nm Many-Core Processor

Abstract: Currently, there is a special interest in validating the use of Commercial-Off-The-Shelf (COTS) multi/many-core processors for critical applications thanks to their high performance, low power consumption and affordability. However, the continuous shrinking of transistor geometry and the increasing complexity of these devices dramatically affect their sensitivity to natural radiation, and thus diminish their reliability. One of the most common effects produced by natural radiation is the Single Event Upset whi… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Year Published

2019
2019
2021
2021

Publication Types

Select...
2

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
references
References 29 publications
0
0
0
Order By: Relevance