Evaluating sub-pixel functional defects of a display using an arbitrary resolution camera

Ferreira, Flávio P.; Forte, Paulo M.F.; Felgueiras, Paulo Eduardo Reis; Bret, Boris P. J.; Belsley, M.; Nunes-Pereira, Eduardo J.

doi:10.1016/j.displa.2017.06.001

Cited by 5 publications

(6 citation statements)

References 10 publications

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“…Many factors contribute to these defects such as the nonuniform color of color filter substrate, the anisotropy of polarizer, the non-uniformly distributed liquid crystal material, the open or shorted scanning lines, the defective TFTs, the unevenness of TFT-array substrate, and the foreign particles within liquid crystal [215]. According to [216], [217], FPD defects can be approximately classified into three types: area defects, line defects and point defects. While Nam et al in [15] classified them into achromatic and chromatic.…”

Section: Othermentioning

confidence: 99%

“…These kinds of defects require high resolution capabilities for the optical inspections system, therefore optical coherence tomography (OCT) was proposed to aid the image acquisition system. Ferreira et al in [217] investigated a type of point defects that evaluates sub-pixel functional defects in the pixel of the display. They have also considered a special type of point defect that is called joint defects which are the defects that occurs on small number of adjacent pixels.…”

Section: Othermentioning

confidence: 99%

“…Table 7 summarizes the defects investigated in literature using AOI system for different FPD types. [250] Mura defects [251]- [256] TFT-LCD panel defects [218], [257], [258] TFT-LCD panel micro-defects such as pinholes, scratches, particles and fingerprints [29], [223], [259], [260] Polarising film defects [261]- [263] Glass substates defects in TFT-LCD [264] Defects during photolithography process [231], [232], [265]- [267] Backlight defects [212], [213], [268], [269] GE operation defects during TFT array process [270], [271] SD operation defects during TFT array process [272], [273] Color filter defects [214] TFT array defects such as fibre defect, particle defect, pattern damage, pattern residual and pattern scratch [274]- [277] Anisotropic Conductive Film defects [278] Optical thin film defects [279] TFT-LCD pad area defects [280] LCD surface deformation for smartphones [224], [225], [225]- [227] Polarizer transparent microdefect [230] Liquid resin defects [217] Subpixel (dots) functional defects OLED [235], [236] Directional textured surface defects in OLED and PLED …”

Section: Othermentioning

confidence: 99%

“…Haar-wavelet transform were also used to eliminate the influence of uneven illumination. Ferreira et al in [217] took advantage of the periodicity and used Fourier filtering technique with the aid of thresholding to highlight dots defects in FPDs. The factor that was under scope in this study was the luminous intensity of dots, such that defective dots may be identified by changes in the expected light functional response to their addressing digital value.…”

Section: ) Frequency Domain Analysismentioning

confidence: 99%

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A Review and Analysis of Automatic Optical Inspection and Quality Monitoring Methods in Electronics Industry

2020

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Electronics industry is one of the fastest evolving, innovative, and most competitive industries. In order to meet the high consumption demands on electronics components, quality standards of the products must be well-maintained. Automatic optical inspection (AOI) is one of the non-destructive techniques used in quality inspection of various products. This technique is considered robust and can replace human inspectors who are subjected to dull and fatigue in performing inspection tasks. A fully automated optical inspection system consists of hardware and software setups. Hardware setup include image sensor and illumination settings and is responsible to acquire the digital image, while the software part implements an inspection algorithm to extract the features of the acquired images and classify them into defected and non-defected based on the user requirements. A sorting mechanism can be used to separate the defective products from the good ones. This article provides a comprehensive review of the various AOI systems used in electronics, microelectronics , and opto-electronics industries. In this review the defects of the commonly inspected electronic components, such as semiconductor wafers, flat panel displays, printed circuit boards and light emitting diodes, are first explained. Hardware setups used in acquiring images are then discussed in terms of the camera and lighting source selection and configuration. The inspection algorithms used for detecting the defects in the electronic components are discussed in terms of the preprocessing, feature extraction and classification tools used for this purpose. Recent articles that used deep learning algorithms are also reviewed. The article concludes by highlighting the current trends and possible future research directions.

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Section: Othermentioning

confidence: 99%

Section: Othermentioning

confidence: 99%

Section: Othermentioning

confidence: 99%

Section: ) Frequency Domain Analysismentioning

confidence: 99%

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A Review and Analysis of Automatic Optical Inspection and Quality Monitoring Methods in Electronics Industry

2020

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“…However, the lower yield, which is especially due to the processing defects, is still a main concern which adversely affects the OLED display cost [6,7]. During the fabrication and operation of the display panel, different kinds of defects develop, which lead to a defective display with lower luminescence, poor contrast ratio and short panel lifetime [8][9][10][11][12][13][14].…”

Section: Introductionmentioning

confidence: 99%

An efficient and facile method to develop defect-free OLED displays

Solanki

Awasthi

Unni

2021

Semicond. Sci. Technol.

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Organic light emitting diodes (OLEDs) have captured the attention of the flat-panel display market owing to their high luminescence and versatile properties. However, substrate processing plays a critical part in the fabrication of OLED displays, demonstrated here as a passive matrix display, where plenty of defects, which appear during the processing stage, result in poor display quality and yield. Photolithography is the most common technique used to develop the electrode pattern on a transparent glass substrate. Nevertheless, poor lithography leads to display defects such as dead pixels, dark columns and bright horizontal rows. Moreover, shorts between anodes due to partial etching of the transparent conducting material or cathode lines are also common problems. Herein, we discuss a technique which drastically reduces the number of electrode shorts. Selective etching of the cathode in this technique makes the optical inspection of electrode shorts far easier due to the higher contrast ratio between Cr/glass compared to indium tin oxide/glass. Further, a focused laser beam is employed to ablate the identified shorts between two or more anode/cathode lines to make the short-free patterns. Additionally, a laser beam is also capable of isolating the burnt/dead pixels in a display, which otherwise lead to dark or bright lines during operation. Thus, our findings are very important for the display industry to develop defect-free panels and for the repair of certain operational defects to increase the production yield and lifetime.

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Toward Intelligent Display with Neuromorphic Technology

Zhang,

Liu,

Liu

et al. 2024

Advanced Materials

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In the era of the Internet and the Internet of Things, display technology has evolved significantly toward full‐scene display and realistic display. Incorporating ‘intelligence’ into displays is a crucial technical approach to meet the demands of this development. Traditional display technology relies on distributed hardware systems to achieve intelligent displays but encounters challenges stemming from the physical separation of sensing, processing, and light‐emitting modules. The high energy consumption and data transformation delays limited the development of intelligence display, breaking the physical separation is crucial to overcoming the bottlenecks of intelligence display technology. Inspired by the biological neural system, neuromorphic technology with all‐in‐one features is widely employed across various fields. It proves effective in reducing system power consumption, facilitating frequent data transformation, and enabling cross‐scene integration. Neuromorphic technology shows great potential to overcome display technology bottlenecks, realizing the full‐scene display and realistic display with high efficiency and low power consumption. In this review, we offer a comprehensive summary of recent advancements in the application of neuromorphic technology in displays, with a focus on interoperability. We delve into its state‐of‐the‐art designs and potential future developments aimed at revolutionizing display technology.This article is protected by copyright. All rights reserved

show abstract

Evaluating sub-pixel functional defects of a display using an arbitrary resolution camera

Cited by 5 publications

References 10 publications

A Review and Analysis of Automatic Optical Inspection and Quality Monitoring Methods in Electronics Industry

A Review and Analysis of Automatic Optical Inspection and Quality Monitoring Methods in Electronics Industry

An efficient and facile method to develop defect-free OLED displays

Toward Intelligent Display with Neuromorphic Technology

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