2013
DOI: 10.1016/j.sna.2013.05.030
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Estimation of the long-term stability of piezoresistive LTCC pressure sensors by means of low-frequency noise measurements

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Cited by 21 publications
(11 citation statements)
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“…As showed in [16] the stability of the sensors' offset voltage and the sensitivity are related to the low-frequency noise of the output signal. A lower noise level corresponds to a better long-term stability while the sensors with higher noise of the output voltage may have poor long term stability.…”
Section: Ageing Due To Intrinsic Irregularitiesmentioning
confidence: 95%
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“…As showed in [16] the stability of the sensors' offset voltage and the sensitivity are related to the low-frequency noise of the output signal. A lower noise level corresponds to a better long-term stability while the sensors with higher noise of the output voltage may have poor long term stability.…”
Section: Ageing Due To Intrinsic Irregularitiesmentioning
confidence: 95%
“…Previous studies [16,17] have shown that the operating conditions in the regime of frequent overloading have non-negligible effects on the aging of such sensors. For efficient maintenance, accurate readings of such sensors including appropriate monitoring of the sensors performances and the operation conditions would be beneficial.…”
Section: Fig 2 Typical Response Of the 100-mbar Sensor Measured At mentioning
confidence: 99%
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“…Nevertheless, the stability of the key characteristics was found to be satisfactory for accurate measurements in a wide range of applications. A recent study of the long-term stability [115] showed that low-frequency noise measurements can reveal uncritical defects and imperfections in the thick-film resistors that cannot be detected by using conventional inspection and standard functional tests. The sensors with such defects are potentially unstable e.g.…”
Section: Piezoresistive Principlementioning
confidence: 99%
“…Moreover, the noise spectroscopy give us integral information about the complete state of a device and may inform about faults in its design, quality of electrical contacts and conducting paths, applied manufacturing processes, long-term stability, etc. An increased level of noise or unusual shape of the noise spectra usually indicate failure mechanisms in particular devices [14][15][16][17][18]. Several authors showed that fluctuation analysis enables to extract a more selective response from the chemical sensors, [19][20][21][22][23][24], surface acoustic wave sensors, and resonant sensors [25,26].…”
Section: Introductionmentioning
confidence: 99%