Estimating IC susceptibility to single-event latchup

Common methodological approach to evaluation of radiation resistance of gate arrays and semicustom very large scale ICs based on them

“…The impact of individual nuclear particles can lead to catastrophic failures, latch-up, and also to single failures [6,7] arising in registers of memory cells and other serial devices. A specific class of radiation effects, which is important for IC on GA with decreasing design rules and, consequently, increasing limit frequencies of operation, are digital "needles" (Digital SET) -short-term interferences that lead to false switching of the trigger or omissions of the clock signal [8][9][10]. These "needles" can be external and internal.…”

Possibilities and limitations of focused laser technique application for SEE sensitivity parameters estimation

“…Альтернативой является метод экспериментальных исследований, основанный на применении сфокусированного лазерного излучения (ЛИ) пикосекундной длительности [4][5][6][7]. Метод основан на том, что с помощью ЛИ пытаются в полупроводниковой структуре смоделировать пространственно-временное распределение избыточных носителей заряда, такое же, как и при прохождении ТЗЧ.…”

Non-Stable Single Event Latch-up

“…The generally accepted practice to estimate SEL sensitivity of VLSI is based on monitoring the average current flowing through the power supply using current meters built into power supplies that can track the dynamics in the range of units and tens of milliseconds [4], [5].Once a SEL has been detected, it is parried by power cycling the device under test. With this method of SEL registering, it is rather difficult to track non-stable SELs, the duration of which can be units of microseconds.…”