Establishing traceability for the measurement of scattering parameters in coaxial line systems

Zeier, M.; Hoffmann, Johannes; Hürlimann, P.; Rufenacht, J.; Stalder, Daniel; Wollensack, Michael

doi:10.1088/1681-7575/aaa21c

Cited by 15 publications

(9 citation statements)

References 47 publications

(68 reference statements)

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“…Traceability for this calibration is derived from mechanical measurements of the transmission-lines that are used for calibrating the VNA. The impedance of these transmission lines is directly calculable from their geometry and the low loss of the metals used [26][27][28][29][30]. Traceability for other coaxial VNA measurements in our traceability path is assured in the same way.…”

Section: Mismatch Correctionmentioning

confidence: 98%

Waveform metrology: signal measurements in a modulated world

2018

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Section: Mismatch Correctionmentioning

confidence: 98%

Waveform metrology: signal measurements in a modulated world

2018

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“…The VNA measurement model shown in Fig. 1 [7,8,12]. Thus, it more precisely propagates the uncertainty in the reference calibration kit to each ECU state.…”

Section: Appendix D Uncertainty Of Ecu Statesmentioning

confidence: 99%

Uncertainty Analysis of Scattering Parameters Calibrated by an Electronic Calibration Unit Based on a Residual Model

et al. 2022

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We propose a new residual model to analyze the uncertainty of scattering parameters (Sparameters) calibrated by an electronic calibration unit (ECU). Residual errors are usually estimated from the observed ripple after connecting a load or a short at the end of an airline. Therefore, this ripple method can only be used in a frequency range where the airline loss was not large. We, however, obtained the residual error from the uncertainty of the calibration kit using a simple numerical approach. As a result, we can determine the correlations between real/imaginary and magnitude/phase uncertainties. The proposed residual model showed the same results as the VNA error model. We also added a new error term to account for the effect of temperature-dependent drift of the ECU. In addition, we analytically derived the sensitivity coefficients for a 2-port DUT based on the proposed residual model. The proposed residual model will be helpful for the uncertainty analysis of S-parameters calibrated using the ECU.

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“…In METAS, the VNA error terms were over-determined based on all the dimensions of the coaxial lines. This approach is known to be the most accurate [2]. The dotted black line shows the uncertainty of the evaluated results.…”

Section: Measurementmentioning

confidence: 99%

“…Several methods have been introduced for pin-gap correction of the calibration standards. In previous work [2], [3], the calibration standards were modeled, including the pin gaps, using a 3D electromagnetic (EM) simulator. A nonlinear fitting process was performed to obtain the error terms.…”

Section: Introductionmentioning

confidence: 99%

“…2), are not corrected using the correction method. This is because the pin gaps of the DUT should be considered inherent characteristics of the DUT, and the pin gaps of the VNA test ports are implicitly included in the error box after calibration [2]. The pin gaps of Line1, Line2, and Reflect used in the LRL calibration are d L1A , d L1B , d L2A , d L2B , d RA , and d RB , respectively, as shown in Fig.…”

Section: Introductionmentioning

confidence: 99%

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Pin-Gap Correction of Coaxial Calibration Standards for TRL or LRL Calibration

et al. 2022

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In this paper, a novel method is proposed by which to correct the pin gaps of coaxial calibration standards for Thru-Reflect-Line (TRL) or Line-Reflect-Line (LRL) calibration. This method is a post-process in which the pin-gap correction is applied to the measured S-parameters of the device under test (DUT) after TRL or LRL calibration. It is based on the perturbation equations derived from the sensitivity-coefficient approach. These equations enable us to obtain the correction quantity of the DUT-S-parameter due to the pin gaps. We verify the proposed method by simulation for a 2.4 mm coaxial line, and the result shows that the pin-gap correction works successfully. Because the method is based on the perturbation equations, the smaller the pin gap, the better the correction results. Nevertheless, we can achieve sufficient correction results within the range of the pin-gap to at least 10 times the nominal value. In addition, the proposed pin-gap correction can play the role of impedance renormalization, even though the two LRL calibration lines have different characteristic impedance. Finally, we demonstrate the correction method for a 2.4 mm coaxial LRL calibration kit through measurement.

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Establishing traceability for the measurement of scattering parameters in coaxial line systems

Cited by 15 publications

References 47 publications

Waveform metrology: signal measurements in a modulated world

Waveform metrology: signal measurements in a modulated world

Uncertainty Analysis of Scattering Parameters Calibrated by an Electronic Calibration Unit Based on a Residual Model

Pin-Gap Correction of Coaxial Calibration Standards for TRL or LRL Calibration

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