2018
DOI: 10.1088/1681-7575/aad1cd
|View full text |Cite
|
Sign up to set email alerts
|

Waveform metrology: signal measurements in a modulated world

Abstract: Optoelectronic time-domain characterization of a 100 GHz sampling oscilloscope H Füser, S Eichstädt, K Baaske et al.-100 GHz pulse waveform measurement based on electro-optic sampling Zhigang Feng, Kejia Zhao, Zhijun Yang et al.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2
1

Citation Types

0
3
0

Year Published

2019
2019
2023
2023

Publication Types

Select...
6
2

Relationship

0
8

Authors

Journals

citations
Cited by 35 publications
(5 citation statements)
references
References 136 publications
(246 reference statements)
0
3
0
Order By: Relevance
“…4a, the measured phases against the reference ones derived from the propagation delay measurements are depicted. The maximum obtained standard deviation is 0.0019 • for the transmission line of 508 mm length, against the uncertainty of 0.00014 • of the reference phase measurements obtained according to (2). Fig.…”
Section: Prototype Implementationmentioning
confidence: 78%
See 1 more Smart Citation
“…4a, the measured phases against the reference ones derived from the propagation delay measurements are depicted. The maximum obtained standard deviation is 0.0019 • for the transmission line of 508 mm length, against the uncertainty of 0.00014 • of the reference phase measurements obtained according to (2). Fig.…”
Section: Prototype Implementationmentioning
confidence: 78%
“…In several test procedures, sine-wave signal generators are adopted as sources of excitation for assessing the performance of waveform recorders [1], [2], [3], [4]. Those generators are often used to determine the magnitude and phase of the frequency response of waveform recorders (e.g., oscilloscopes) [5].…”
Section: Introductionmentioning
confidence: 99%
“…The VNA is currently the most accurate instrument for measuring these multiple reflections, and the errors made by this frequency sampling instrument manifest themselves as correlated time domain errors in the magnitudes, shapes, and positions of the multiple reflections. Statistical uncertainties in VNA measurements cannot be transformed correctly into the time domain without an unbiased accounting of correlations created by the domain transformation [6].…”
Section: Bias In the Combine Modulementioning
confidence: 99%
“…Assume the sets of Y j and S q are independent. Suppose further that the Transform outputs N (T) j = F( Y j , ν ) and M (T) jq are given by ( 4) and ( 5) with F as in (6), and the Combine outputs N (C) and M (C) q are given by ( 7) and (8). Then…”
Section: Bias In the Combine Modulementioning
confidence: 99%
“…The VNA is currently the most accurate instrument for measuring these multiple reflections, and the errors made by this frequency sampling instrument typically manifest themselves as correlated time domain errors in the magnitudes, shapes, and positions of the multiple reflections. Statistical uncertainties in VNA measurements cannot be transformed correctly into the time domain without accounting for correlations created by the domain transformation [1].…”
Section: Introductionmentioning
confidence: 99%