2010
DOI: 10.1038/nmat2702
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Erratum: Three-dimensional imaging of strain in a single ZnO nanorod

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Cited by 7 publications
(6 citation statements)
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“…During the past two decades, one dimensional (1D) semiconductor nanomaterials, including nanorods, 1 nanowires, 2 nanobelts, 3 nanotubes, 4 and so forth, have aroused considerable research interest due to their unique geometry shape with a high surface-to-volume ratio and exceptional physicochemical properties. [5][6][7] Among these nanostructures, 1D ZnO nanomaterials, [8][9][10] especially ZnO nanotubes, have attracted particular attention because of their excellent photonic and electric properties.…”
Section: Introductionmentioning
confidence: 99%
“…During the past two decades, one dimensional (1D) semiconductor nanomaterials, including nanorods, 1 nanowires, 2 nanobelts, 3 nanotubes, 4 and so forth, have aroused considerable research interest due to their unique geometry shape with a high surface-to-volume ratio and exceptional physicochemical properties. [5][6][7] Among these nanostructures, 1D ZnO nanomaterials, [8][9][10] especially ZnO nanotubes, have attracted particular attention because of their excellent photonic and electric properties.…”
Section: Introductionmentioning
confidence: 99%
“…[26,27] With CXDI it is possible to visualize single grains, defects, and strain with high precision inside functional materials [28,29] by reconstructing the complex amplitude and phase in small nanometer to micrometer sized single crystal objects. [30][31][32] Due to its high crystallinity and simplicity of production, ZnO nanocrystals and rods have been a common subject. [31,33,34] CXDI was further employed to visualize the strain field inside other nanoparticles including lead, [35] polycrystalline particles in thin gold films, [28] and batteries.…”
Section: Introductionmentioning
confidence: 99%
“…[30][31][32] Due to its high crystallinity and simplicity of production, ZnO nanocrystals and rods have been a common subject. [31,33,34] CXDI was further employed to visualize the strain field inside other nanoparticles including lead, [35] polycrystalline particles in thin gold films, [28] and batteries. [29,36] In this study, complementary techniques of reciprocal and real space analyses by means of Bragg CXDI and geometric phase analysis (GPA) performed on transmission electron microscopy (TEM) micrographs were used to visualize the 3D and the estimated relative local strain distribution in piezotronic ZnO/Au microstructures in order to understand how it affects the Schottky barrier and related electrical properties.…”
Section: Introductionmentioning
confidence: 99%
“…Since the first experimental demonstration of this lensless imaging technique by Miao et al (1999), coherent diffraction imaging (CDI) has undergone rapid development using synchrotron radiation (Robinson & Harder, 2009;Chapman & Nugent, 2010;Miao et al, 2002Pfeifer et al, 2006;Chapman, Barty, Marchesini et al, 2006), X-ray free-electron lasers (X-FELs) (Chapman, Barty, Bogan et al, 2006;Seibert et al, 2011;Mancuso et al, 2010;Schlichting & Miao, 2012), high harmonic generation (Sandberg et al, 2007(Sandberg et al, , 2008Ravasio et al, 2009;Seaberg et al, 2011), soft X-ray lasers (Sandberg et al, 2007) and electrons (Zuo et al, 2003;Dronyak, 2009;De Caro, 2010). Various forms of CDI methods have been developed, including planewave CDI (Miao et al, 1999(Miao et al, , 2002Chapman, Barty, Marchesini et al, 2006;Chapman, Barty, Bogan et al, 2006;Seibert et al, 2011;Sandberg et al, 2007;Zuo et al, 2003), Bragg CDI (Robinson & Harder, 2009;Pfeifer et al, 2006;Newton et al, 2010), scanning (or ptychographic) CDI (Rodenburg et al, 2007;Thibault et al, 2008;Giewekemeyer et al, 2010), reflection CDI (Marathe et al, 2010;Roy et al, 2011), Fresnel CDI (Williams et al, 2006) and others (Abbey et al, 2008;Szameit et al, 2012). ...…”
Section: Introductionmentioning
confidence: 99%