The magnetic field induced strain at the interface of a magnetoelectric composite, consisting of a ZnO(001) piezoelectric substrate and an amorphous (Fe90Co10)78Si12B10 magnetostrictive layer, was directly determined by grazing incidence X-ray diffraction. Upon applying a magnetic field along the [110] direction, the ZnO single crystal is under tensile strain in [110] direction and compressive strain in [1-10] direction, in agreement with the magnetostriction in the (Fe90Co10)78Si12B10 layer. At room temperature, the saturation strain along [1-10] of about 3 × 10−5 is close to the saturation magnetostriction of the film measured with the cantilever bending technique.

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X-ray reflectivity studies of the structure of liquid-vapour and liquid-liquid interfaces at modern sources, such as free-electron lasers, are currently impeded by the lack of dedicated liquid surface diffractometers. It is shown that this obstacle can be overcome by an alternative experimental approach that uses the natural curvature of a liquid drop for variation of the angle of incidence. Two modes of operation are shown: (i) sequential reflectivity measurements by a nanometre beam and (ii) parallel acquisition of large ranges of a reflectivity curve by micrometre beams. The feasibility of the two methods is demonstrated by studies of the Hg/vapour, HO/vapour and Hg/0.1 M NaF interface. The obtained reflectivity curves match the data obtained by conventional techniques up to 5α in micro-beam mode and up to 35α in nano-beam mode, allowing observation of the Hg layering peak.

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